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Laser & Optoelectronics Progress, Volume. 62, Issue 12, 1212003(2025)

f-Scan for Optical Nonlinear Measurement Method Based on Spatial Light Modulator

Yujie Zhao1, Yiran Shi1, Xuanming Liang1, Deshun Li1, Yongqiang Chen1, Yu Fang1, Xingzhi Wu1、*, Quanying Wu1、**, and Yinglin Song2、***
Author Affiliations
  • 1Key Laboratory of Efficient Low-Carbon Energy Conversion and Utilization of Jiangsu Provincial Higher Education Institutions, School of Physical Science and Technology, Suzhou University of Science and Technology, Suzhou 215009, Jiangsu , China
  • 2School of Physics, Harbin Institute of Technology, Harbin 150001, Heilongjiang , China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (11)
    Equations (13)
    References (36)
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    Figures & Tables(11)
    Parameters in Z-scan and PM f-scan

    Fig. 1. Parameters in Z-scan and PM f-scan

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    Schematic of experimental setup for PM f-scan

    Fig. 2. Schematic of experimental setup for PM f-scan

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    Z-scan curves of ZnSe. (a) Open aperture; (b) closed aperture

    Fig. 3. Z-scan curves of ZnSe. (a) Open aperture; (b) closed aperture

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    Open aperture PM f-scan curves of ZnSe with focal length range of 340‒400 mm. (a) Uncorrected; (b) corrected

    Fig. 4. Open aperture PM f-scan curves of ZnSe with focal length range of 340‒400 mm. (a) Uncorrected; (b) corrected

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    Diffraction efficiency of m-order foci

    Fig. 5. Diffraction efficiency of m-order foci

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    Open aperture PM f-scan curves of ZnSe with focal length range of 270‒330 mm. (a) Uncorrected; (b) corrected

    Fig. 6. Open aperture PM f-scan curves of ZnSe with focal length range of 270‒330 mm. (a) Uncorrected; (b) corrected

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    Open aperture PM f-scan curves of ZnSe with focal length range of 420‒480 mm. (a) Uncorrected; (b) corrected

    Fig. 7. Open aperture PM f-scan curves of ZnSe with focal length range of 420‒480 mm. (a) Uncorrected; (b) corrected

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    Closed aperture PM f-scan curves of ZnSe with focal length range of 340‒400 mm. (a) PM f-scan curve (circles) and reference PM f-scan curve (triangles); (b) corrected closed aperture PM f-scan curves; (c) nonlinear refraction curves of PM f-scan

    Fig. 8. Closed aperture PM f-scan curves of ZnSe with focal length range of 340‒400 mm. (a) PM f-scan curve (circles) and reference PM f-scan curve (triangles); (b) corrected closed aperture PM f-scan curves; (c) nonlinear refraction curves of PM f-scan

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    • Table 1. Nonlinear absorption fitting parameters with focal length range of 270‒330 mm

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      Table 1. Nonlinear absorption fitting parameters with focal length range of 270‒330 mm

      TypePeak intensity /（GW/cm2）β /（m/W）
      Uncorrected2.232.1×10-11
      2.732.2×10-11
      Corrected1.565.6×10-11
      1.915.8×10-11

    • Table 2. Nonlinear absorption fitting parameters with focal length range of 420‒480 mm

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      Table 2. Nonlinear absorption fitting parameters with focal length range of 420‒480 mm

      TypePeak intensity /（GW/cm2）β /（m/W）
      Uncorrected1.372.6×10-11
      1.742.6×10-11
      Corrected0.966.0×10-11
      1.225.8×10-11

    • Table 3. Comparison of measurement methods

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      Table 3. Comparison of measurement methods

      TypePrincipleMeasurement parametersAdvantagesDisadvantages
      Z-scanBeam-distortionβ， n2Simple optical setup； distinguish the sign of the nonlinear refractive indexEffects of sample movement； difficulties in beam alignment
      f-scanBeam-distortionβ， n2Fixed position of sampleEmploy an electrically focus-tunable lens； aligning the beam center is complicated； focal length variation is constricted
      PM f-scanBeam-distortionβ， n2Simple optical setup； fixed position of sample； flexible control of beams based on SLMExistence of secondary foci； restricted diffraction efficiency
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    Yujie Zhao, Yiran Shi, Xuanming Liang, Deshun Li, Yongqiang Chen, Yu Fang, Xingzhi Wu, Quanying Wu, Yinglin Song. f-Scan for Optical Nonlinear Measurement Method Based on Spatial Light Modulator[J]. Laser & Optoelectronics Progress, 2025, 62(12): 1212003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 1, 2024

    Accepted: Jan. 2, 2025

    Published Online: Jun. 25, 2025

    The Author Email: Xingzhi Wu (wuxingzhi@usts.edu.cn), Quanying Wu (wqycyh@mail.usts.edu.cn), Yinglin Song (ylsong@hit.edu.cn)

    DOI:10.3788/LOP242198

    CSTR:32186.14.LOP242198

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology