Laser & Optoelectronics Progress, Volume. 62, Issue 12, 1212003(2025)

f-Scan for Optical Nonlinear Measurement Method Based on Spatial Light Modulator

Yujie Zhao1, Yiran Shi1, Xuanming Liang1, Deshun Li1, Yongqiang Chen1, Yu Fang1, Xingzhi Wu1、*, Quanying Wu1、**, and Yinglin Song2、***
Author Affiliations
  • 1Key Laboratory of Efficient Low-Carbon Energy Conversion and Utilization of Jiangsu Provincial Higher Education Institutions, School of Physical Science and Technology, Suzhou University of Science and Technology, Suzhou 215009, Jiangsu , China
  • 2School of Physics, Harbin Institute of Technology, Harbin 150001, Heilongjiang , China
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    This study proposes modification to f-scan using a liquid-crystal spatial light modulator (SLM). By programmatically controlling the phase of the incident light beam, continuous variation of the focal point along an arbitrary direction is realized, and thus achieve f-scan. A subfocus phenomenon occurs because of the discontinuous phase-modulation depth in the liquid-crystal SLM. Therefore, the intensity of the incident light is corrected based on theoretical analysis. Subsequently, experimental validation is performed using ZnSe materials. Theoretical and experimental studies suggest that the arrangement of this method is simple, and that no beam-collimation issue is caused by sample movement, unlike the Z-scan technique. Furthermore, this method overcomes the stringent precision requirements of coaxial optical systems and mitigates the constraints associated with minimal variations in the focal length of the f-scan technique. Consequently, this approach simplifies the experiment while enabling effective measurements of third-order optical nonlinearity in materials.

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    Yujie Zhao, Yiran Shi, Xuanming Liang, Deshun Li, Yongqiang Chen, Yu Fang, Xingzhi Wu, Quanying Wu, Yinglin Song. f-Scan for Optical Nonlinear Measurement Method Based on Spatial Light Modulator[J]. Laser & Optoelectronics Progress, 2025, 62(12): 1212003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 1, 2024

    Accepted: Jan. 2, 2025

    Published Online: Jun. 25, 2025

    The Author Email: Xingzhi Wu (wuxingzhi@usts.edu.cn), Quanying Wu (wqycyh@mail.usts.edu.cn), Yinglin Song (ylsong@hit.edu.cn)

    DOI:10.3788/LOP242198

    CSTR:32186.14.LOP242198

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