Opto-Electronic Engineering, Volume. 48, Issue 11, 210270(2021)
Polarized cavity ring-down technique for characterization of single-layer SiO2 films
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Wu Meiyu, Wang Jing, Li Bincheng. Polarized cavity ring-down technique for characterization of single-layer SiO2 films[J]. Opto-Electronic Engineering, 2021, 48(11): 210270
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Received: Aug. 20, 2021
Accepted: --
Published Online: Feb. 25, 2022
The Author Email: Wang Jing (jingwang1230@uestc.edu.cn)
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