Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Acta Optica Sinica, Volume. 42, Issue 14, 1430001(2022)

Interferogram Baseline Correction Method Based on Low-Rank Constraint and Penalized Least Squares

Feng Zhu1,2,3, Junshe An1、*, Hailiang Shi3, Hanhan Ye3, Zhiwei Li3, Xianhua Wang3, and Wei Xiong3
Author Affiliations
  • 1Key Laboratory of Electronics and Information Technology for Spacing Systems, National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
  • 3Anhui Institute of Optics and Fine Mechanics, Hefei Institute of Physical Science, Chinese Academy of Sciences, Hefei 230031, Anhui , China
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (8)
    Equations (0)
    References (21)
    Cited By (1)
    Tools
    Paper Information
    Topics
    Figures & Tables(8)
    Low-rank property of interferogram data cube

    Fig. 1. Low-rank property of interferogram data cube

    Download full size
    Flow of proposed LRPLS baseline correction algorithm

    Fig. 2. Flow of proposed LRPLS baseline correction algorithm

    Download full size
    Comparison of spatial-interferogram images using different baseline correction methods. (a) Original SI image; (b) ADF method; (c) polyfit method; (d) EMD method; (e) LRPLS method

    Fig. 3. Comparison of spatial-interferogram images using different baseline correction methods. (a) Original SI image; (b) ADF method; (c) polyfit method; (d) EMD method; (e) LRPLS method

    Download full size
    Influence of outlier to correction effect of different baseline correction methods. (a) ADF method; (b) polyfit method; (c) EMD method; (d) LRPLS method

    Fig. 4. Influence of outlier to correction effect of different baseline correction methods. (a) ADF method; (b) polyfit method; (c) EMD method; (d) LRPLS method

    Download full size
    False-color composite images of recovered hyperspectral image using different baseline correction methods. (a) ADF method; (b) polyfit method; (c) EMD method; (d) LRPLS method

    Fig. 5. False-color composite images of recovered hyperspectral image using different baseline correction methods. (a) ADF method; (b) polyfit method; (c) EMD method; (d) LRPLS method

    Download full size
    Estimated SNR of recovered hyperspectral images using different baseline correction methods

    Fig. 6. Estimated SNR of recovered hyperspectral images using different baseline correction methods

    Download full size
    Sensitivity analysis results of different parameters in LRPLS model. (a) r; (b) λ; (c) α; (d) β

    Fig. 7. Sensitivity analysis results of different parameters in LRPLS model. (a) r; (b) λ; (c) α; (d) β

    Download full size
    Convergence analysis result of LRPLS model

    Fig. 8. Convergence analysis result of LRPLS model

    Download full size
    Tools

    Get Citation

    Copy Citation Text

    Feng Zhu, Junshe An, Hailiang Shi, Hanhan Ye, Zhiwei Li, Xianhua Wang, Wei Xiong. Interferogram Baseline Correction Method Based on Low-Rank Constraint and Penalized Least Squares[J]. Acta Optica Sinica, 2022, 42(14): 1430001

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Spectroscopy

    Received: Nov. 16, 2021

    Accepted: Feb. 17, 2022

    Published Online: Jul. 15, 2022

    The Author Email: An Junshe (anjunshe@nssc.ac.cn)

    DOI:10.3788/AOS202242.1430001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology