EFFECTS OF POWER AGING ON 1/f NOISE CHARACTERISTICS FOR GaAlAs IR LED BAO Jun-Lin ZHUANG Yi-Qi DU Lei MA Zhong-Fa LI Wei-Hua LI Cong

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journal of Infrared and Millimeter Waves, Volume. 25, Issue 1, 33(2006)

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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References(2)

[1] [1] Doru Ursutiu,Brian K Jones.Low-frequency noise used as a lifetime test of LEDs [ J ].Semicond.Sci.Technol.,1996,42(11):1133-1136.

[3] [3] Chen X Y,Pedersen A,Helleso O G,et al.Electrical noise of laser diodes measured over a wide range of bias currents [ J ].Microelectronics Reliability,2000,40 (6):1925-1928.

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. EFFECTS OF POWER AGING ON 1/f NOISE CHARACTERISTICS FOR GaAlAs IR LED BAO Jun-Lin ZHUANG Yi-Qi DU Lei MA Zhong-Fa LI Wei-Hua LI Cong[J]. Journal of Infrared and Millimeter Waves, 2006, 25(1): 33

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Paper Information

Received: Mar. 30, 2005

Accepted: --

Published Online: Jul. 5, 2006

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Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology