Researching | Accelerator simulation test technology and its application for single event effect evaluation in space

NUCLEAR TECHNIQUES, Volume. 46, Issue 8, 080008(2023)

Accelerator simulation test technology and its application for single event effect evaluation in space

Qiming CHEN, Gang GUO^*, Li SUI, Jiancheng LIU, Yanwen ZHANG, Fuqiang ZHANG, Qian YIN, Jinhua HAN, Zheng ZHANG, and Haohan SUN

Author Affiliations

China Institute of Atomic Energy, National Innovation Center of Radiation Application, Beijing 102413, China

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References(13)

[1] WANG Changhe. The influence with reliability of motional satelliteby the single-event phenomena[J]. Semiconductor Information, 35, 1-8(1998).

[2] Barth J L, Dyer C S, Stassinopoulos E G. Space, atmospheric, and terrestrial radiation environments[J]. IEEE Transactions on Nuclear Science, 50, 466-482(2003).

[3] Reed R A, Kinnison J, Pickel J C et al. Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future[J]. IEEE Transactions on Nuclear Science, 50, 622-634(2003).

[5] YU Qingkui, TANG Min, ZHU Huanjing et al[S](2018).

[6] SHEN Dongjun, FAN Hui, GUO Gang et al. Single event effect calibration experiment with ESA single event upset monitor on Beijing HI-13 tandem accelerator[J]. Atomic Energy Science and Technology, 51, 555-560(2017).

[7] Reed R A, Marshall P W, Kim H S et al. Evidence for angular effects in proton-induced single-event upsets[J]. IEEE Transactions on Nuclear Science, 49, 3038-3044(2002).

[8] Zhang Y W, Guo G, Liu J C et al. The proton irradiation facility for single-event effect testing in CIAE[J]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions With Materials and Atoms, 517, 43-48(2022).

[9] Han J H, Guo G, Liu J C et al. Design of 100-MeV proton beam spreading scheme with double-ring double scattering method[J]. Acta Physica Sinica, 68, 054104(2019).

[10] ZHANG Yanwen, GUO Gang, XIAO Shuyan et al. Measurement of medium-energy proton flux[J]. Acta Physica Sinica, 71, 012902(2022).

[11] YIN Qian, GUO Gang, ZHANG Fengqi et al. Experimental research on single-event effect in SRAMs with different feature sizes[J]. Atomic Energy Science and Technology, 54, 1118-1124(2020).

[12] ZHANG Qingxiang, YU Dengyun, LI Yancun et al. Single event sensitivity evaluation by using medium-energy proton accelerated by CYCIAE-100 cyclotron[J]. Spacecraft Environment Engineering, 37, 293-298(2020).

[13] SHI Shuting, GUO Gang, WANG Ding et al. Technique of single event upset mapping[J]. Information and Electronic Engineering, 10, 608-612(2012).

[14] Sun H H, Guo G, Sun R N et al. Study on single event upsets in a 28 nm technology static random access memory device based on micro-beam irradiation[J]. Electronics, 11, 3413(2022).

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Qiming CHEN, Gang GUO, Li SUI, Jiancheng LIU, Yanwen ZHANG, Fuqiang ZHANG, Qian YIN, Jinhua HAN, Zheng ZHANG, Haohan SUN. Accelerator simulation test technology and its application for single event effect evaluation in space[J]. NUCLEAR TECHNIQUES, 2023, 46(8): 080008

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Paper Information

Category: Research Articles

Received: Jun. 17, 2023

Accepted: --

Published Online: Sep. 19, 2023

The Author Email:

DOI:10.11889/j.0253-3219.2023.hjs.46.080008

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology