Raman spectroscopy detection of natural beeswax and paraffin mixture based on backpropagation neural network algorithm

Han Xiaojuan; Wang Yahui; Zhou Fumin; Xu Yangji

doi:10.13883/j.issn1004-5929.202502008

The Journal of Light Scattering, Volume. 37, Issue 2, 213(2025)

Raman spectroscopy detection of natural beeswax and paraffin mixture based on backpropagation neural network algorithm

Han Xiaojuan^1、*, Wang Yahui¹, Zhou Fumin², and Xu Yangji³

Author Affiliations

¹Jinzhong Vocational and Technical College, Jinzhong, Shanxi 030600, China

²College of Food Science and Engineering, Shani Agricultural University, Jinzhong, Shanri 030801, China

³College of Information and Computer, Taiyuan University of Technology, Taiyuan 030024, China

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References(3)

[4] [4] Edwards H G M, Falk M J P. Fourier-transform Raman spectroscopic study of unsaturated and saturated waxes[J]. Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy, 1997, 53(14): 2685-2694.

[16] [16] Polat E, Gunay S. The comparison of partial least squares regression, principal component regression and ridge regression with multiple linear regression for predicting pm10 concentration level based on meteorological parameters[J]. Journal of Data science, 2015, 13(4): 663-692.

[20] [20] Edwards H G M, Farwell D W, Daffner L. Fourier-transform Raman spectroscopic study of natural waxes and resins. I[J]. Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy, 1996, 52(12): 1639-1648.

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Han Xiaojuan, Wang Yahui, Zhou Fumin, Xu Yangji. Raman spectroscopy detection of natural beeswax and paraffin mixture based on backpropagation neural network algorithm[J]. The Journal of Light Scattering, 2025, 37(2): 213

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Paper Information

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Received: Oct. 8, 2024

Accepted: Jul. 31, 2025

Published Online: Jul. 31, 2025

The Author Email: Han Xiaojuan (hanxiaojuan83@163.com)

DOI:10.13883/j.issn1004-5929.202502008

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology