Fig. 1. Typical damage morphology of ITO/glass at a lower fluence (near the LIDT). (b), (c), and (d) show local magnified views of micro-areas outlined by the rectangles 1, 2, and 3 in (a), respectively

Fig. 2. Typical damage morphology and depth profile of the ITO/glass sample at a higher fluence (near 100% damage probability)

Fig. 3. Typical damage morphologies of the PI/ITO/glass sample

Fig. 4. Temperature distribution of the irradiated center in the samples. The dashed lines represent the vaporization temperature of the ITO film

Fig. 5. Schematic diagram of measuring phase modulation of the liquid crystal device induced by the high-average-power laser^[35]

Fig. 6. Morphologies observed by the polarized light microscope for decrease in the laser power density from 141 W/cm² to 133 W/cm²

Fig. 7. Transmitted He-Ne light intensity after the analyzer varies with voltage apllied on the liquid crystal device when the liquid crystal device is irridiated by different laser power densities ^[36]

Fig. 8. Damage morphologies induced by different power densities

Fig. 9. Vertical temperature distribution in first 30 s under 3 000 W/cm² laser irradiation

Fig. 10. Simulation and measurement results of the normalized ransmitted power of the probe laser after the analyzer^[37]