Laser & Optoelectronics Progress, Volume. 60, Issue 17, 1712006(2023)
Double-Temperature Measurements of Arc Plasmas by Integrating Two-Wavelength Moiré and Emission Tomography
Fig. 2. Measured arc plasma and deflected Moiré fringes (0.3 MPa). (a) Arc plasma; (b) 532 nm; (c) 808 nm
Fig. 3. Measured arc plasma and deflected Moiré fringes (0.5 MPa). (a) Arc plasma; (b) 532 nm; (c) 808 nm
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Junyan Zhuang, Yunyun Chen, Yayi Chen. Double-Temperature Measurements of Arc Plasmas by Integrating Two-Wavelength Moiré and Emission Tomography[J]. Laser & Optoelectronics Progress, 2023, 60(17): 1712006
Category: Instrumentation, Measurement and Metrology
Received: Jul. 4, 2022
Accepted: Sep. 26, 2022
Published Online: Aug. 29, 2023
The Author Email: Yunyun Chen (yunqq321@sina.cn)