Laser & Optoelectronics Progress, Volume. 60, Issue 17, 1712006(2023)

Double-Temperature Measurements of Arc Plasmas by Integrating Two-Wavelength Moiré and Emission Tomography

Junyan Zhuang1, Yunyun Chen1,2,3、*, and Yayi Chen1,2,3
Author Affiliations
  • 1School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • 2Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • 3Jiangsu International Joint Laboratory on Meteorological Photonics and Optoelectronic Detection, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
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    Figures & Tables(10)
    Schematic diagram of two-wavelength Moiré and emission tomography
    Measured arc plasma and deflected Moiré fringes (0.3 MPa). (a) Arc plasma; (b) 532 nm; (c) 808 nm
    Measured arc plasma and deflected Moiré fringes (0.5 MPa). (a) Arc plasma; (b) 532 nm; (c) 808 nm
    Referenced Moiré fringes. (a) 532 nm; (b) 808 nm
    3-D distributions of refractive index (0.3 MPa). (a) 532 nm; (b) 808 nm
    3-D distributions of refractive index (0.5 MPa). (a) 532 nm; (b) 808 nm
    Radial refractive index distributions. (a) 0.3 MPa; (b) 0.5 MPa
    Radial intensity distributions. (a) 0.3 MPa; (b) 0.5 MPa
    Ionization degree distributions. (a) 0.3 MPa; (b) 0.5 MPa
    Temperature distributions. (a) 0.3 MPa; (b) 0.5 MPa
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    Junyan Zhuang, Yunyun Chen, Yayi Chen. Double-Temperature Measurements of Arc Plasmas by Integrating Two-Wavelength Moiré and Emission Tomography[J]. Laser & Optoelectronics Progress, 2023, 60(17): 1712006

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 4, 2022

    Accepted: Sep. 26, 2022

    Published Online: Aug. 29, 2023

    The Author Email: Yunyun Chen (yunqq321@sina.cn)

    DOI:10.3788/LOP221975

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