[1] Xu J, Liu S L, Wan A et al. An absolute phase technique for 3D profile measurement using four-step structured light pattern[J]. Optics & Lasers in Engineering, 50, 1274-1280(2012). http://www.sciencedirect.com/science/article/pii/S0143816612000930

[2] Da J, Qu H M, Tao T Y et al. Real-time three-dimensional measurement composite of epipolar constraint and speckle correlation[J]. Acta Optica Sinaca, 36, 1012003(2016).

[3] Wu Q Y, Zeng Z, Zhang B C et al. A 360° three-dimensional measurement system and its calibration[J]. Chinese Journal of Lasers, 44, 0404002(2017).

[4] Liu Y K, Su X Y, Wu Q Y. Three-dimensional shape measurement for specular surface based on fringe reflection[J]. Acta Optica Sinaca, 26, 1636-1640(2006).

[5] Ou P, Wang T, Li R X. A three-dimensional teeth measurement system based on structured light[J]. Laser & Optoelectronics Progress, 53, 011102(2016).

[6] Zhang H, Ji L S, Liu S G et al. Three-dimensional shape measurement of a highly reflected, specular surface with structured light method[J]. Applied Optics, 51, 7724-7732(2012). http://www.ncbi.nlm.nih.gov/pubmed/23128725

[7] Yuan T, Zhang F, Tao X P et al. Test of optical mirror surface using fringe reflection system[J]. Acta Photonica Sinica, 44, 86-91(2015).

[8] Sun X, Liu Y, Yu X et al. Three-dimensional measurement for specular reflection surface based on reflection component separation and priority region filling theory[J]. Sensors, 17, 215(2017). http://europepmc.org/articles/PMC5298786/

[9] Xiao Y L, Su X Y, Chen W J. Specular shape measurement with phase measuring deflectometry based on bundle adjustment[J]. Acta Optica Sinaca, 31, 1212007(2011).

[10] Cao H L, Cheng Z H, Yu L Y. Reconstruction of 3D surface of mirror by processing fringe pattern[J]. Optics and Precision Engineering, 15, 599-603(2007).

[11] Song L, Yue H M, Wu Y X et al. Surface profile measurement of specular cell phone cases on variable lateral scales by fringe reflection technique[J]. Journal of Optoelectronics·Laser, 23, 2154-2162(2012).

[12] Xiao Y L, Su X Y, Chen W J. Flexible geometrical calibration for fringe-reflection 3D measurement[J]. Optics Letters, 37, 620-622(2012). http://www.ncbi.nlm.nih.gov/pubmed/22344126

[13] Ren H Y, Gao F, Jiang X Q. Iterative optimization calibration method for stereo deflectometry[J]. Optics Express, 23, 22060-22068(2015). http://www.opticsinfobase.org/abstract.cfm?uri=oe-23-17-22060

[14] Zhang Z H, Liu Y, Huang S J et al. Full-field 3D shape measurement of specular surfaces by direct phase to depth relationship[C]. Proceedings of the SPIE, 23, 100230X(2016).

[15] Liu Y, Huang S J, Zhang Z H et al. Full-field 3D shape measurement of discontinuous specular objects by direct phase measuring deflectometry[J]. Scientific Reports, 7, 10293(2017). http://europepmc.org/abstract/MED/28860573

[16] Zhang Z. A flexible new technique for camera calibration[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 22, 1330-1334(2000). http://doi.ieeecomputersociety.org/10.1109/34.888718

[17] Xing D K, Da F P, Zhang H. Research and application of locating of circular target with high accuracy[J]. Chinese Journal of Scientific Instrument, 30, 2593-2598(2009).

[18] Chen X Y, Ma Z, Hu Y et al. A new method for accurate location of concentric circles in visual measurement[J]. Journal of Optoelectronics·Laser, 24, 1524-1528(2013).

[19] Zhang Z H, Huang S J, Meng S S et al. A simple, flexible and automatic 3D calibration method for a phase calculation-based fringe projection imaging system[J]. Optics Express, 21, 12218-12227(2013). http://europepmc.org/abstract/med/23736442

[20] Wang Z Y, Nguyen D A, Barnes J C. Some practical considerations in fringe projections profilometry[J]. Optics and Lasers in Engineering, 48, 218-225(2010). http://www.sciencedirect.com/science/article/pii/S0143816609001493

[21] Zheng D L, Da F P. Gamma correction method for accuracy enhancement in grating projection profilometry[J]. Acta Optica Sinica, 31, 0512003(2011).

[22] Liu Y K, Olesch E, Yang Z et al. A one-dimensional phase-shift technique based on dual-frequency crossed fringe for phase measuring deflectometry[J]. Chinese Journal of Lasers, 42, 0308005(2015).

[23] Zhang Z H, Guo J, Wang Y M et al. Parallel-alignment and correction of two displays in three-dimensional measuring system of specular surfaces[J]. Optics and Precision Engineering, 25, 289-296(2017).

[24] Creath K. V phase-measurement interferometry techniques[J]. Progress in Optics, 26, 349-393(1998). http://www.sciencedirect.com/science/article/pii/S0079663808701781