Fig. 1. Experimental schematic. Top view of the noncollinear interaction area where two filaments interfere and create a plasma grating, with a focus lens collecting the plasma emission into the spectrometer from the side direction after plasma grating ablating the sample pellet.

Fig. 2. (a) Intensity of the Si 288.2 nm line as a function of the laser pulse energy detected with the FIBS and GIBS systems. (b) Intensity of the Si 288.2 nm line obtained by interaction of two beams with different polarizations.

Fig. 3. Time evolution for intensities of four spectral lines (Al 394.5 nm, Ca 393.4 nm, Mg 517.3 nm, and Si 288.2 nm) detected with (a) an FIBS and (b) a GIBS system.

Fig. 4. Intensity of the Cr 425.43 nm line as a function of the prepared Cr concentration detected with (a) ns-LIBS, (b) fs-LIBS, (c) FIBS, and (d) GIBS systems.