Absorption and Refractive Index Sensitivity of the I-Shaped Elliptical Nanostructures

Yiqin Kuang; Gang Li; Zhuqing Yan; Yanjun Zhang; Zhidong Zhang; Xianwei Hao

doi:10.3788/AOS202040.1424001

Acta Optica Sinica, Volume. 40, Issue 14, 1424001(2020)

Absorption and Refractive Index Sensitivity of the I-Shaped Elliptical Nanostructures

Yiqin Kuang^1,2, Gang Li^1,2, Zhuqing Yan^1,2, Yanjun Zhang^1,2、*, Zhidong Zhang^1,2, and Xianwei Hao³

Author Affiliations

¹School of Instrument and Electronics, North University of China, Taiyuan, Shanxi 0 30051, China

²Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan, Shanxi 0 30051, China

³Beijing Institute of Aerospace Engineering, Beijing 100000, China

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Yiqin Kuang, Gang Li, Zhuqing Yan, Yanjun Zhang, Zhidong Zhang, Xianwei Hao. Absorption and Refractive Index Sensitivity of the I-Shaped Elliptical Nanostructures[J]. Acta Optica Sinica, 2020, 40(14): 1424001

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Paper Information

Category: Optics at Surfaces

Received: Jan. 17, 2020

Accepted: Apr. 14, 2020

Published Online: Jul. 23, 2020

The Author Email: Zhang Yanjun (zhangyanjun@nuc.edu.cn)

DOI:10.3788/AOS202040.1424001

Topics

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