Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Laser & Optoelectronics Progress, Volume. 58, Issue 4, 0410008(2021)

Fabric Defect Detection Method Based on Coarseness Measurement and Color Distance

Mengfan Ren, Lei Zhu*, Xiaomin Ma, and Lin Cui
Author Affiliations
  • School of Electronics and Information, Xi'an Polytechnic University, Xi'an, Shaanxi 710048, China
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (6)
    Equations (0)
    References (19)
    Cited By (2)
    Tools
    Paper Information
    Topics
    Cited By

    Article index updated: Mar. 15, 2025

    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
    Tools

    Get Citation

    Copy Citation Text

    Mengfan Ren, Lei Zhu, Xiaomin Ma, Lin Cui. Fabric Defect Detection Method Based on Coarseness Measurement and Color Distance[J]. Laser & Optoelectronics Progress, 2021, 58(4): 0410008

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category: Image Processing

    Received: Jun. 16, 2020

    Accepted: Aug. 6, 2020

    Published Online: Feb. 8, 2021

    The Author Email: Zhu Lei (zhulei791014@163.com)

    DOI:10.3788/LOP202158.0410008

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology