Spectral Characteristics Identification Method for the Incubation Period of Chili Early Blight Disease

SHEN Meng-jiao; BAO Hao; ZHANG Yan

doi:10.3964/j.issn.1000-0593(2024)10-2923-09

Spectroscopy and Spectral Analysis, Volume. 44, Issue 10, 2923(2024)

Spectral Characteristics Identification Method for the Incubation Period of Chili Early Blight Disease

SHEN Meng-jiao¹, BAO Hao², and ZHANG Yan^1,2、*

Author Affiliations

¹Guiyang University, Guizhou Agricultural Products Nondestructive Testing Center, Guiyang　550005, China

²School of Big Data and Information Engineering, Guizhou University, Guiyang　550025, China

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References(9)

[2] [2] Wang Jinhui, Xiao Siyu, Zheng Lijia, et al. Phytopathology Research, 2022, 4(1): 29.

[3] [3] Karada K, Tenekeci M E, Tasaltin R, et al. Sustainable Computing: Informatics and Systems, 2020, 28: 100299.

[4] [4] Atas M, Yardimci Y, Temizel A. Computers and Electronics in Agriculture, 2012, 87: 129.

[6] [6] Yang C H. Engineering, 2020, 6: 528.

[8] [8] Chen Tingting, Zhang Jialei, Chen Yong, et al.Computers and Electronics in Agriculture, 2019, 156: 677.

[9] [9] Hou Bingru, Hu Yaohua, Zhang Peng, et al. Agriculture, 2022, 12(7): 897.

[10] [10] Gao Jianmeng, Ding Mingliang, Sun Qiuyu, et al. Remote Sensing, 2022, 14(11): 2551.

[12] [12] Chang Chein-I. IEEE Transactions on Information Theory, 2000, 46(5): 1927.

[17] [17] Kruse F A, Lefkoff A B, Boardman J W, et al. AIP Conference Proceedings, 1993, 283: 192.

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SHEN Meng-jiao, BAO Hao, ZHANG Yan. Spectral Characteristics Identification Method for the Incubation Period of Chili Early Blight Disease[J]. Spectroscopy and Spectral Analysis, 2024, 44(10): 2923

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Paper Information

Received: May. 15, 2023

Accepted: Jan. 16, 2025

Published Online: Jan. 16, 2025

The Author Email: ZHANG Yan (Eileen_zy001@sohu.com)

DOI:10.3964/j.issn.1000-0593(2024)10-2923-09

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