Dual-Hole Point Diffraction Interferometer for Measuring the Wavefront Aberration of an Imaging System

Peng Feng; Feng Tang; Xiangzhao Wang; Yunjun Lu; Jinghao Xu; Fudong Guo; Guoxian Zhang

doi:10.3788/CJL202148.0904002

Chinese Journal of Lasers, Volume. 48, Issue 9, 0904002(2021)

Dual-Hole Point Diffraction Interferometer for Measuring the Wavefront Aberration of an Imaging System

Peng Feng^1,2, Feng Tang^1,2、*, Xiangzhao Wang^1,2, Yunjun Lu^1,2, Jinghao Xu¹, Fudong Guo¹, and Guoxian Zhang¹

¹Laboratory of Information Optics and Opto-Electronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

show less

Abstract Get PDF(in Chinese)

Cited By

Article index updated: Mar. 10, 2025

The article is cited by 4 article(s) CLP online library. (Some content might be in Chinese.)

Tools

Get Citation

Copy Citation Text

Peng Feng, Feng Tang, Xiangzhao Wang, Yunjun Lu, Jinghao Xu, Fudong Guo, Guoxian Zhang. Dual-Hole Point Diffraction Interferometer for Measuring the Wavefront Aberration of an Imaging System[J]. Chinese Journal of Lasers, 2021, 48(9): 0904002

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: measurement and metrology

Received: Nov. 9, 2020

Accepted: Dec. 21, 2020

Published Online: May. 6, 2021

The Author Email: Tang Feng (tangfeng@siom.ac.cn)

DOI:10.3788/CJL202148.0904002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology