Chinese Journal of Lasers, Volume. 51, Issue 8, 0804004(2024)

Double-Resolution Wave Plate Measurement Based on Equivalent Components and Phase Compensation

Qianghua Chen*, Duo Shao, Fuming Liu, Yu Guan, Lü Hongbo, Lina Si, Hongjuan Yan, and Zhaoliang Dou
Author Affiliations
  • School of Mechanical and Materials Engineering, North China University of Technology, Beijing 100144, China
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    Figures & Tables(4)
    Schematic of the measurement optical system
    Physical diagram of the measurement optical system
    • Table 1. Measurement result of a quarter wave plate

      View table

      Table 1. Measurement result of a quarter wave plate

      No.ΔΦmax /(°)ψmax /(°)ΔΦmin /(°)ψmin /(°)Phase retardationFast axis azimuth
      τ /(°)Average/(°)Standard deviation /(')θ /(°)Average /(°)Standard deviation /(''
      1371.56368.4266.43123.42691.28391.281.6136.852136.8525.4
      2288.73968.426-76.40623.42591.286136.852
      3243.35568.427-121.62623.42691.245136.854
      4413.72568.42548.44523.42691.320136.850
      5533.76868.425168.60523.42591.291136.850
      6446.21768.42681.20623.42591.253136.852
    • Table 2. Phase retardation measurement results and comparison of half wave plates and quarter wave plates

      View table

      Table 2. Phase retardation measurement results and comparison of half wave plates and quarter wave plates

      No.By presented methodPhase retardation by the apparatus /(°)

      Deviation /

      (')

      Phase retardation at different experiments /(°)

      Average /

      (°)

      Standard deviation /(′)
      123456
      191.28391.28691.24591.32091.29191.25391.281.691.242.4
      290.34290.35790.36190.28890.35290.29190.332.090.42-5.3
      3177.206177.178177.239177.255177.191177.229177.221.8177.28-3.8
      4182.507182.459182.448182.525182.492182.515182.491.9182.452.5
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    Qianghua Chen, Duo Shao, Fuming Liu, Yu Guan, Lü Hongbo, Lina Si, Hongjuan Yan, Zhaoliang Dou. Double-Resolution Wave Plate Measurement Based on Equivalent Components and Phase Compensation[J]. Chinese Journal of Lasers, 2024, 51(8): 0804004

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    Paper Information

    Category: Measurement and metrology

    Received: Aug. 31, 2023

    Accepted: Nov. 22, 2023

    Published Online: Apr. 17, 2024

    The Author Email: Chen Qianghua (chenqianghua@tsinghua.org.cn)

    DOI:10.3788/CJL231157

    CSTR:32183.14.CJL231157

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