[1] [1] Li Jianxin, Meng Xin, Zhou Wei, et al. Image plane interferometric hyperspectral imaging based on reimaging［J］. Acta Optica Sinca, 2012, 32(12): 1230001.

[2] [2] Jacquinot P. The etendue advantage［C］. XVII Meeting of Congrès Du Groupment Avancement Des Méthodes D′analyse Spectrométriques, 1954.

[3] [3] Loewenstein E V. Fourier spectroscopy: An introduction［C］. Aspen International Conference on Fourier Spectroscopy, 1970, 952(85): 784-801.

[4] [4] Fellgett P B. The multiplex advantage［D］. Cambridge: University of Cambridge, 1951.

[5] [5] Fellgett P B. On the ultimate sensitivity and practical performance of radiation detectors［J］. Journal of the Optical Society of America, 1949, 39(11): 970-976.

[6] [6] Xue Peng, Wang Zhibin, Zhang Rui, et al. Highly efficient measurement technology based on hyper-spectropolarimetric imaging［J］. Chinese J Lasers, 2016, 43(8): 0811001.

[7] [7] Dong Ying, Xiangli Bin, Zhao Baochang. Analysis of interferometer system in a large aperture static imaging spectrometer［J］. Acta Optica Sinica, 2001, 21(3): 330-334.

[8] [8] Green R O. Lessons and key results from 30 years of imaging spectroscopy［C］. SPIE, 2014, 9222: 92220B.

[9] [9] Horton R F. Optical design for a high-etendue imaging Fourier-transform spectrometer［C］. SPIE, 1996, 2819: 300-315.

[10] [10] Liu Yang, Liao Ningfang, Bai Tingzhu, et al. Study of the structure of large aperture ultraviolet Fourier transform imaging spectrometer［J］. Acta Optica Sinica, 2014, 34(3): 0330001.

[11] [11] Zhang Zhinan, Li Libo, Hu Bingliang, et al. Study and design of Fourier transform imaging spectrometer with wide field of view［J］. Acta Optica Sinica, 2016, 36(1): 0130001.

[12] [12] Horton R F, Byers T, Conger C, et al. HEIFTS phase II: Laboraory and advanced simulation results［C］. SPIE, 2000, 4132: 195-205.

[13] [13] Harlander J, Tran H T, Roesler F L, et al. Field-widened spatial heterodyne spectroscopy: Correcting for optical defects and new vacuum ultraviolet performance tests［C］. SPIE, 1994, 2280: 310-319.

[14] [14] Liang Quanting. Physical optics［M］. 4th ed. Beijing: Publishing House of Electronics Industry, 2008: 40-41.