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Chinese Optics Letters, Volume. 5, Issue 11, 11680(2007)

Impact of organic contamination in vacuum on laser-induced damage threshold of TiO2/SiO2 dielectric mirrors

Yun Cui1,2、*, Hua Yu1,2, Yuanan Zhao1,2, Yunxia Jin1,2, Hongbo He1, and Jianda Shao1
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
  • 2Graduate School of the Chinese Academy of Sciences, Beijing 100039
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    [1] [1] H. A. Abdeldayem, E. Dowdye, J. Canham, and T. Taeger, Proc. SPIE 5897, 589705 (2005).

    [2] [2] P. Allenspacher, W. Riede, D. Wernham, A. Capanni, and F. Era, Proc. SPIE 5991, 599128 (2005).

    [3] [3] W. Riede and P. Allenspacher, in Proceeding of the 5th ICSO 2004 839 (2004).

    [4] [4] C. Scurlock, Proc. SPIE 5647, 86 (2005).

    [5] [5] ISO 11254-1, Determination of Laser Induced Damage Threshold of Optical Surfaces-Part 1: 1-on-1 Test (2000).

    [6] [6] Laser-Induced Damage Threshold and Certification Procedures for Optical Materials (NASA RP-1395,1997).

    CLP Journals

    [1] Caihua Huang, Yiyu Xue, Zhilin Xia, Yuan'an Zhao, Fangfang Yang, Peitao Guo, "Damage induced by femtosecond laser in optical dielectric films," Chin. Opt. Lett. 7, 0149 (2009)

    [2] Ping Ma, Feng Pan, Songlin Chen, Zhen Wang, Jianping Hu, Qinghua Zhang, Jianda Shao, "Contamination process and laser-induced damage of HfO2/SiO2 coatings in vacuum," Chin. Opt. Lett. 7, 07643 (2009)

    [3] Ling Xiulan, Li Dawei, Zhao Yuan′an, Li Shuhong, Shao Jianda, Fan Zhengxiu. Effects of Environments and Gas Pressures on Laser-Induced Damage of Anti-Reflection Films[J]. Chinese Journal of Lasers, 2009, 36(11): 3055

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    Yun Cui, Hua Yu, Yuanan Zhao, Yunxia Jin, Hongbo He, Jianda Shao, "Impact of organic contamination in vacuum on laser-induced damage threshold of TiO2/SiO2 dielectric mirrors," Chin. Opt. Lett. 5, 11680 (2007)

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    Paper Information

    Category: Atmospheric and oceanic optics

    Received: Jun. 22, 2007

    Accepted: --

    Published Online: Nov. 14, 2007

    The Author Email: Yun Cui (cuiyun@siom.ac.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology