1.5-m flat imaging system aligned and phased in real time

Zongliang Xie; Kaiyuan Yang; Yang Liu; Tianrong Xu; Botao Chen; Xiafei Ma; Yong Ruan; Haotong Ma; Junfeng Du; Jiang Bian; Dun Liu; Lihua Wang; Tao Tang; Jiawei Yuan; Ge Ren; Bo Qi; Hu Yang

doi:10.1364/PRJ.486637

Photonics Research, Volume. 11, Issue 7, 1339(2023)

1.5-m flat imaging system aligned and phased in real time Spotlight on Optics

Zongliang Xie^1,2,3、†, Kaiyuan Yang^1,2,3、†, Yang Liu^1,2、†, Tianrong Xu^1,2, Botao Chen^1,2, Xiafei Ma^1,2, Yong Ruan^1,2,3, Haotong Ma^1,2,3,4, Junfeng Du^1,2, Jiang Bian^1,2,3, Dun Liu², Lihua Wang^2,3, Tao Tang^1,2,3, Jiawei Yuan^1,2, Ge Ren^1,2,3, Bo Qi^1,2,3、*, and Hu Yang^1,2,3,5

Author Affiliations

¹Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu 610209, China

²Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China

³University of Chinese Academy of Sciences, Beijing 100049, China

⁴e-mail: mahaotong@163.com

⁵e-mail: yanghu@ioe.ac.cn

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Supplementary Materials

Visualization 1 | The whole process of pushing out the flat lens, which simulates the operation of deployment of the planar observation in space.

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Visualization 2 | The whole procedure of aligning and phasing the 1.5-meter flat imaging system, including the two-order alignment, coarse phasing, and fine phasing. It is noted that the play speed is slowed down to clearly show the procedure.

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Zongliang Xie, Kaiyuan Yang, Yang Liu, Tianrong Xu, Botao Chen, Xiafei Ma, Yong Ruan, Haotong Ma, Junfeng Du, Jiang Bian, Dun Liu, Lihua Wang, Tao Tang, Jiawei Yuan, Ge Ren, Bo Qi, Hu Yang, "1.5-m flat imaging system aligned and phased in real time," Photonics Res. 11, 1339 (2023)

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Paper Information

Category: Instrumentation and Measurements

Received: Feb. 10, 2023

Accepted: May. 1, 2023

Published Online: Jun. 29, 2023

The Author Email: Bo Qi (qibo@ioe.ac.cn)

DOI:10.1364/PRJ.486637

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology