Laser & Infrared, Volume. 55, Issue 3, 388(2025)

A phase-locked loop design for high-speed readout circuits

FANG Kai1,2, DONG Rui-qing2, and LI Jing-guo2、*
Author Affiliations
  • 1Shandong University, Jinan 250000, China
  • 2North China Research Institute of Electro-Optics, Beijing 100015, China
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    With the digital development of readout circuits in infrared detector systems, the requirements for clock signals in readout circuits are becoming increasingly stringent to ensure accurate processing of digital signals, including computation, transmission, and storage. In this paper, a high-speed clock signal generation circuit based on a charge pump phase-locked loop structure with excellent comprehensive performance is designed to achieve fast locking and stable output of a 640 MHz low-noise high-speed clock signal under the condition of a 20 MHz reference clock signal from the crystal oscillator. The designed is based on SMIC 0.18μm process, and the simulation result shows that total power consumption is less than 5 mW at 1.8 V power supply, the control voltage ripple after the phase-locked loop is kept within 500 μV, the locking time is 4μs, the phase noise is less than -99 dBc/ Hz@1MHz, and the clock jitter is less than 5 ps.

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    FANG Kai, DONG Rui-qing, LI Jing-guo. A phase-locked loop design for high-speed readout circuits[J]. Laser & Infrared, 2025, 55(3): 388

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    Paper Information

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    Received: Jul. 10, 2024

    Accepted: Apr. 23, 2025

    Published Online: Apr. 23, 2025

    The Author Email: LI Jing-guo (lijg@live.com)

    DOI:10.3969/j.issn.1001-5078.2025.03.010

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