Femtosecond pulses cleaning by transient-grating process in Kerr-optical media

Jun Liu; Kotaro Okamura; Yuichiro Kida; Takayoshi Kobayashi

doi:10.3788/COL201109.051903

Chinese Optics Letters, Volume. 9, Issue 5, 051903(2011)

Femtosecond pulses cleaning by transient-grating process in Kerr-optical media

Jun Liu^1,2,3, Kotaro Okamura^1,2, Yuichiro Kida^1,2, and Takayoshi Kobayashi^1,2,4,5

¹Advanced Ultrafast Laser Research Center, and Department of Engineering Science, Faculty of Informatics and Engineering, Department of Engineering Science, The University of Electro-Communications,1-5-1, Chofugaoka, Chofu, Tokyo 182-8585, Japan

²International Cooperative Research Project (ICORP), Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan

³State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

⁴Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Rd. Hsinchu 300, China

⁵Institute of Laser Engineering, Osaka University, Yamadakami 2-6, Suita, Osaka 565-0871, Japan

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Cited By

[1] L. Gulyás Oldal, T. Csizmadia, P. Ye, N. G. Harshitha, M. Füle, A. Za?r. Double-pulse characterization by self-referenced spectral interferometry. Applied Physics Letters, 115, 051106(2019).

[2] Xiong Shen, Peng Wang, Jun Liu, Takayoshi Kobayashi, Ruxin Li. Self-Referenced Spectral Interferometry for Femtosecond Pulse Characterization. Applied Sciences, 7, 407(2017).

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Jun Liu, Kotaro Okamura, Yuichiro Kida, Takayoshi Kobayashi, "Femtosecond pulses cleaning by transient-grating process in Kerr-optical media," Chin. Opt. Lett. 9, 051903 (2011)

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Paper Information

Category: Nonlinear Optics

Received: Nov. 9, 2010

Accepted: Jan. 3, 2011

Published Online: Apr. 22, 2011

The Author Email:

DOI:10.3788/COL201109.051903

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology