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Chinese Optics Letters, Volume. 16, Issue 10, 102401(2018)

Optical rectification in surface layers of germanium

Li Zhang1, Fangye Li1, Shuai Wang1, Qi Wang1, Kairan Luan1, Xi Chen1, Xiuhuan Liu2, Lingying Qiu3, Zhanguo Chen1、*, Jihong Zhao1, Lixin Hou4, Yanjun Gao1, and Gang Jia1
Author Affiliations
  • 1State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
  • 2College of Communication Engineering, Jilin University, Changchun 130012, China
  • 3State Key Laboratory of Supramolecular Structure and Materials, Institute of Theoretical Chemistry, Jilin University, Changchun 130012, China
  • 4College of Information Technology, Jilin Agricultural University, Changchun 130118, China
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    Ge samples and the measurement setup of EFI OR. (a) The Ge(001) samples; (b) the Ge(110) samples; (c) the Ge(111) samples; (d) the metal–semiconductor–metal configuration of Ge samples; (e) the measurement system for EFI OR.

    Fig. 1. Ge samples and the measurement setup of EFI OR. (a) The Ge(001) samples; (b) the Ge(110) samples; (c) the Ge(111) samples; (d) the metal–semiconductor–metal configuration of Ge samples; (e) the measurement system for EFI OR.

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    EFI OR signals versus the polarization azimuth of the probing beam in the (a) Ge(001), (b) Ge(110), and (c) Ge(111) surface layers.

    Fig. 2. EFI OR signals versus the polarization azimuth of the probing beam in the (a) Ge(001), (b) Ge(110), and (c) Ge(111) surface layers.

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    Distribution of the normalized EFI OR signals along the normal direction of the Ge crystal. (a) Along the 001 direction for the Ge(001) samples. (b) Along the 110 direction for the Ge(110) samples.

    Fig. 3. Distribution of the normalized EFI OR signals along the normal direction of the Ge crystal. (a) Along the 001 direction for the Ge(001) samples. (b) Along the 110 direction for the Ge(110) samples.

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    Li Zhang, Fangye Li, Shuai Wang, Qi Wang, Kairan Luan, Xi Chen, Xiuhuan Liu, Lingying Qiu, Zhanguo Chen, Jihong Zhao, Lixin Hou, Yanjun Gao, Gang Jia, "Optical rectification in surface layers of germanium," Chin. Opt. Lett. 16, 102401 (2018)

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    Paper Information

    Category: Optics at Surfaces

    Received: Jul. 5, 2018

    Accepted: Aug. 17, 2018

    Published Online: Oct. 12, 2018

    The Author Email: Zhanguo Chen (czg@jlu.edu.cn)

    DOI:10.3788/COL201816.102401

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology