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Electro-Optic Technology Application, Volume. 39, Issue 6, 21(2024)

Research on Sweep Frequency Laser Source for Testing in 50G PON Architecture

GE Chonglin1, ZHENG Ce1, SHENG Liwen1,2,3, and HUANG Lin1,2,3
Author Affiliations
  • 1Ceyear Technologies Co., Ltd., Qingdao, China
  • 2Shandong Electronic Test & Measurement Technology Innovation Center, Qingdao, China
  • 3Science and Technology on Electronic Test & Measurement Laboratory, Qingdao, China
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    GE Chonglin, ZHENG Ce, SHENG Liwen, HUANG Lin. Research on Sweep Frequency Laser Source for Testing in 50G PON Architecture[J]. Electro-Optic Technology Application, 2024, 39(6): 21

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    Paper Information

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    Received: Oct. 9, 2024

    Accepted: Feb. 18, 2025

    Published Online: Feb. 18, 2025

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology