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Laser & Optoelectronics Progress, Volume. 57, Issue 20, 201104(2020)

Speckle Design Method Based on Principal Component Analysis

Dong Zhou1, Jie Cao1、*, Yahui Jiang1, Yongchao Feng2, and Qun Hao1
Author Affiliations
  • 1Key Laboratory of Robotics and Systems, Ministry of Education, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China
  • 2China Electronics Technology Instruments Co., Ltd, Qingdao, Shandong 266555, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (8)
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    References (15)
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    Figures & Tables(8)
    Decomposition of gray image

    Fig. 1. Decomposition of gray image

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    Binary image split by grayscale image

    Fig. 2. Binary image split by grayscale image

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    Sample database. (a) STL-10 dataset; (b) ImageNet dataset

    Fig. 3. Sample database. (a) STL-10 dataset; (b) ImageNet dataset

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    Speckle obtained by PCA training

    Fig. 4. Speckle obtained by PCA training

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    System of correlation imaging

    Fig. 5. System of correlation imaging

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    Imaging target. (a) Pentagram; (b) Cameraman

    Fig. 6. Imaging target. (a) Pentagram; (b) Cameraman

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    Imaging results of different matrices on the actual scene. (a) PCA (pentagram); (b) Walsh-Hadamard (pentagram); (c) PCA (Cameraman); (d) Walsh-Hadamard (Cameraman)

    Fig. 7. Imaging results of different matrices on the actual scene. (a) PCA (pentagram); (b) Walsh-Hadamard (pentagram); (c) PCA (Cameraman); (d) Walsh-Hadamard (Cameraman)

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    PSNR and SSIM of the reconstruction image. (a) Pentagram; (b) Cameraman

    Fig. 8. PSNR and SSIM of the reconstruction image. (a) Pentagram; (b) Cameraman

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    Dong Zhou, Jie Cao, Yahui Jiang, Yongchao Feng, Qun Hao. Speckle Design Method Based on Principal Component Analysis[J]. Laser & Optoelectronics Progress, 2020, 57(20): 201104

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    Paper Information

    Category: Imaging Systems

    Received: Jan. 17, 2020

    Accepted: Mar. 6, 2020

    Published Online: Oct. 14, 2020

    The Author Email: Jie Cao (ajieanyyn@163.com)

    DOI:10.3788/LOP57.201104

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology