[1] Jones A C, Kearns N M, Ho J J et al. Impact of non-equilibrium molecular packings on singlet fission in microcrystals observed using 2D white-light microscopy[J]. Nature Chemistry, 12, 40-47(2020).

[2] Yin Z Y, Guo R H, Yang X et al. Measurement method for surface defects on ICF capsules based on white light interferometry[J]. Acta Optica Sinica, 42, 1012004(2022).

[3] Li W C, Yuan Y G, Yang J et al. Review of optical fiber sensor network technology based on white light interferometry[J]. Photonic Sensors, 11, 31-44(2021).

[4] Larimer C, Brann M R, Powell J D et al. Rapid nondestructive measurement of bacterial cultures with 3D interferometric imaging[J]. Scientific Reports, 9, 8055(2019).

[5] Brann M, Suter J D, Addleman R S et al. Monitoring bacterial biofilms with a microfluidic flow chip designed for imaging with white-light interferometry[J]. Biomicrofluidics, 11, 044113(2017).

[6] Pekkarinen M, Karvinen P, Saarinen J. Additive manufacturing of double-sided centimeter-scale optics[J]. Optics Express, 32, 10618-10629(2024).

[7] Su R, Liu J Y, Qiao X Y et al. Advances in scanning white light interferometry for surface topography measurement[J]. Laser & Optoelectronics Progress, 60, 0312005(2023).

[8] Victor O. Measurement of the thickness of transparent coatings by interferometry[D](2020).

[9] Salzenstein F, Montgomery P, Boudraa A O. Local frequency and envelope estimation by Teager-Kaiser energy operators in white-light scanning interferometry[J]. Optics Express, 22, 18325-18334(2014).

[10] Sandoz P. Wavelet transform as a processing tool in white-light interferometry[J]. Optics Letters, 22, 1065-1067(1997).

[11] Lei Z L, Liu X J, Chen L Z et al. A novel surface recovery algorithm in white light interferometry[J]. Measurement, 80, 1-11(2016).

[12] Shen M H, Hwang C H, Wang W C. Using higher steps phase-shifting algorithms and linear least-squares fitting in white-light scanning interferometry[J]. Optics and Lasers in Engineering, 66, 165-173(2015).

[13] Zhang L W, Chen H B, Sun W Q et al. Review of anti-vibration technology in phase-shifting interferometry[J]. Laser & Optoelectronics Progress, 60, 1900005(2023).

[14] Bi S X, Duan M L, Zong Y et al. High-precision dynamic white-light interferometry[J]. Acta Optica Sinica, 42, 0512002(2022).

[15] Xue L, Guo R H, Liu Y et al. Anti-vibration white light interferometry based on non-uniform fast Fourier transform[J]. Acta Optica Sinica, 44, 0412006(2024).

[16] Zhao Y. Research on surface recovery algorithm in white light interferometry based on phase noise correction[D], 7-9(2023).

[17] Liang H G, Yao D, Shen H H. Pseudo Wigner-Ville distribution for 3D white light scanning interferometric measurement[J]. Optics Express, 30, 40540-40556(2022).

[18] Ma L, Zhao Y, Pei X et al. Phase noise estimation based white light scanning interferometry for high-accuracy surface profiling[J]. Optics Express, 30, 11912-11922(2022).

[19] Teale C, Barbastathis G, Schmidt M A. Vibration compensated, scanning white light interferometer for in situ depth measurements in a deep reactive ion etcher[J]. Journal of Microelectromechanical Systems, 28, 441-446(2019).

[20] Kim N, Kwon S. Correction of PZT scanner errors using a phase compensation method in white-light phase-shifting interferometry[J]. Applied Optics, 60, 9311-9318(2021).

[21] Ji C S, Luo S J, Sasaki O et al. Exact surface measurement based on phase error insensitive method for white-light scanning interferometer[J]. Surface Topography: Metrology and Properties, 12, 025025(2024).

[22] Ma L, Jia J, Pei X et al. A robust surface recover algorithm based on random phase noise correction for white light interferometry[J]. Optics and Lasers in Engineering, 128, 106016(2020).

[23] Wang X Z, Luo Y R, Zhai Z S et al. Algorithm for sine wave cure fit based on frequency precise estimation[C], 357-361(2017).

[24] Wang X Z, Wang A H, Yin J P et al. Improved measurement accuracy based on moving sine-wave fitting for ultrasonic ranging[J]. Shock and Vibration, 2022, 9570857(2022).

[25] Zhao H, Xie Y J, Zhu R L et al. Robust vertical scanning interferometry at a long coherence length[J]. Optics and Lasers in Engineering, 186, 108769(2025).

[26] Pappas A, Hooshmand H, Su Rongm et al. Determination of the influence of enironmental vibration on the evaluation of measurement noise using a virtual instrument[EB/OL]. https:∥www.researchgate.net/publication/374589316

[27] Cui K H, Liu Q, Huang X J et al. Scanning error detection and compensation algorithm for white-light interferometry[J]. Optics and Lasers in Engineering, 148, 106768(2022).

[28] Sandoz P. An algorithm for profilometry by white-light phase-shifting interferometry[J]. Journal of Modern Optics, 43, 1545-1554(1996).

[29] Zhu J. Study of key processing algorithms for white light interferometry system[D], 33-34(2023).

[30] Xin L, Dou J T, Yang Z M et al. Composite wavelet decomposition algorithm combined with correlation analysis in white-light scanning interferometry[J]. Results in Physics, 40, 105870(2022).

[31] Li Y R, Yang Y Z, Zhang J L et al. Envelope peak detection algorithm based on the CEEMDAN in white light interferometry[J]. Optics Continuum, 2, 1875(2023).

[32] Vo Q S, Fang F Z, Zhang X D et al. Surface recovery algorithm in white light interferometry based on combined white light phase shifting and fast Fourier transform algorithms[J]. Applied Optics, 56, 8174-8185(2017).

[33] de Groot P, Deck L. Surface profiling by analysis of white-light interferograms in the spatial frequency domain[J]. Journal of Modern Optics, 42, 389-401(1995).

[34] Deng Q Y, Huang Q Q, Hou J et al. Analysis and restriction about accumulated phase error in spacial frequency-domain algorithm for white-light interferometry[J]. Laser & Optoelectronics Progress, 58, 0718001(2021).