Infrared and Laser Engineering, Volume. 44, Issue 9, 2825(2015)
Calibration method for angular measurement of Moiré patterns based on template matching
[1] [1] Brian Deboo, Jose Sasian. Precision focal-length measurement technique with a relative fresnel-zone hologram[J]. Applied Optics, 2003, 42(19): 3903-3909.
[2] [2] Meshcheryakov V I, Sinel’nikov M I, Filippov O K. Measuring the focal lengths of long-focus optical systems[J]. Journal of Optical Technology, 1999, 66(5): 458-459.
[3] [3] Zhao Weiqian, Sun Ruoduan, Qiu Lirong, et al. Laser differential confocal radius measurement[J]. Optical Exprecess, 2010, 18(3): 2345-2360.
[4] [4] Yoshiaki Nakano, Kazumi Murata. Measurements of phase objects using the talbot effect and Moiré techniques[J]. Applied Optics, 1984, 23(14): 2296-2299.
[5] [5] Yoshiaki Nakano, Kazumi Murata. Talbot interferometry for measuring the focal length of a lens[J]. Applied Optics, 1985, 24(19): 3162-3166.
[6] [6] Sun Chen, Shen Yibin, Bai Jian, et al. Precision limit analysis of long focal length testing based on Talbot effect of Ronchi grating[J]. Photonica Sinica, 2004, 33(10): 1214-1217.
[7] [7] Hou Changlun, Bai Jian, Hou Xiyun. Measurement of long focal length based on Talbot effect of Ronchi grating[J]. Optica Sinica, 2002(11): 332-335.
[8] [8] Sun Tao, Song Yizhong. Analyzing Moiré pattern spectra based on the mutual transform between signals′ waveform in time domain and their spectra in frequency space[J].Spectroscopy and Spectral Analysis, 2013, 33(11): 1134-1137.
[9] [9] Takeda M, Ina Hideki, Kobayashi Seji. Moiré Stereomicroscope[J]. Opt Soc Am, 1982, 13: 72-156.
[10] [10] De Nicola S, Ferraro P. A two-dimensional fast fourier transform method for measuring the inclination angle of parallel fringe patterns[J]. Optics & Laser Technology, 1998, 30(3): 167-173.
[11] [11] Zhu Yanhua. Analysis of solving least squares fitting parameters[J]. Time Education, 2012(19): 61-64.
Get Citation
Copy Citation Text
He Fan, Bai Jian, Hou Xiyun. Calibration method for angular measurement of Moiré patterns based on template matching[J]. Infrared and Laser Engineering, 2015, 44(9): 2825
Category: 光电测量
Received: Jan. 11, 2015
Accepted: Feb. 13, 2015
Published Online: Jan. 26, 2016
The Author Email:
CSTR:32186.14.