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Acta Optica Sinica, Volume. 20, Issue 8, 1128(2000)

Determination of Optical Parameters of GeTe Semiconductor Films Annealed at Different Temperatures

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Determination of Optical Parameters of GeTe Semiconductor Films Annealed at Different Temperatures[J]. Acta Optica Sinica, 2000, 20(8): 1128

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    Paper Information

    Category: Materials

    Received: Apr. 13, 1999

    Accepted: --

    Published Online: Aug. 9, 2006

    The Author Email:

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology