Chinese Journal of Lasers, Volume. 20, Issue 5, 349(1993)
Analysis of measurement results of residual reflectivity at AR coated facets of semiconductor lasers
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis of measurement results of residual reflectivity at AR coated facets of semiconductor lasers[J]. Chinese Journal of Lasers, 1993, 20(5): 349
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