Optoelectronic Technology, Volume. 43, Issue 1, 62(2023)

Design of Diffractive Optical Element Based on Extended Scalar Diffraction Theory

Liangliang YANG, Fahua SHEN, Qi ZHAO, Jianli LIU, and Yongbing ZHAO
Author Affiliations
  • Jiangsu Province Intelligent Optoelectronic Devices and Measurement Control Engineering Research Center, School of Physics and Electronics Engineering, Yancheng Teachers University, Yancheng Jiangsu 224007, CHN
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    Figures & Tables(9)
    Analysis model of DOE
    Relationship between BIADE and wavelength at normal incidence
    Relationship between BIADE and incident angle
    Diagrams of microstructure height
    BIADE versus wavelength
    • Table 1. Related parameters obtained based on SDT

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      Table 1. Related parameters obtained based on SDT

      入射角度/(°)0153045
      BIADE最大值/(%)95.52995.53095.53495.540
      设计波长/μm1.9461.9451.9461.949
      微结构高度/μm1.5371.5141.4481.346
    • Table 2. Relationship between microstructure height and period width at several different incident angles

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      Table 2. Relationship between microstructure height and period width at several different incident angles

      入射角度/(°)P/μm
      51550
      01.5791.5421.5381.537
      151.6151.5371.5201.514
      301.5951.4851.4581.448
      451.5251.3921.3591.346
    • Table 3. Structural parameters at 5 μm period width

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      Table 3. Structural parameters at 5 μm period width

      参数入射角度/(°)
      0153045
      BIADE最大值/(%)95.52995.53095.53495.540
      设计波长/μm1.8991.8381.7871.752
      微结构高度/μm1.5391.5151.4491.348
    • Table 4. Structural parameters at 15 μm period width

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      Table 4. Structural parameters at 15 μm period width

      参数入射角度/(°)
      0153045
      BIADE最大值/(%)95.52995.53095.53495.540
      设计波长/μm1.9411.9191.9001.888
      微结构高度/μm1.5381.5151.4481.348
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    Liangliang YANG, Fahua SHEN, Qi ZHAO, Jianli LIU, Yongbing ZHAO. Design of Diffractive Optical Element Based on Extended Scalar Diffraction Theory[J]. Optoelectronic Technology, 2023, 43(1): 62

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    Paper Information

    Category: Technology and Measurement

    Received: Sep. 16, 2022

    Accepted: --

    Published Online: Apr. 14, 2023

    The Author Email:

    DOI:10.19453/j.cnki.1005-488x.2023.01.010

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