Spectral Uncertainty of Terrestrial Objects and the Applicability of Spectral Angle Mapper Algorithm

Cen Yi; Zhang Genzhong; Zhang Lifu; Lu Xuhui; Zhang Feizhou

doi:10.3964/j.issn.1000-0593(2015)10-2841-05

Spectroscopy and Spectral Analysis, Volume. 35, Issue 10, 2841(2015)

Spectral Uncertainty of Terrestrial Objects and the Applicability of Spectral Angle Mapper Algorithm

Cen Yi^1,2, Zhang Genzhong^1,3, Zhang Lifu¹, Lu Xuhui⁴, and Zhang Feizhou^5、*

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

⁴[in Chinese]

⁵[in Chinese]

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References(10)

[2] [2] Hapke B. Journal of Geophysical Research: Solid Earth(1978—2012), 1981, 86(B4): 3039.

[3] [3] Cloutis E A. International Journal of Remote Sensing, 1996, 17(12): 2215.

[4] [4] Christopher Hecker, Mark Van der Meijde, et al. IEEE Transactions on Geoscience and Remote Sensing, 2008, 46(12): 4162.

[7] [7] Baugh W M, Kruse F A, Atkinson Jr W W. Remote Sensing of Environment, 1998, 65(3): 292.

[8] [8] Fan F, Deng Y. International Journal of Applied Earth Observation and Geoinformation, 2014, 33: 290.

[9] [9] Li H, Lee W S, Wang K, et al. Precision Agriculture, 2014, 15(2): 162.

[10] [10] Park B, Windham W R, Lawrence K C, et al. Biosystems Engineering, 2007, 96(3): 323.

[11] [11] van der Meer F. Int. J. Appl. Earth Observation Geoinformation, 2006, 8(1): 3.

[12] [12] Crosta A P, Sabine C, Taranik J V. Remote Sensing of Environment, 1998, 65(3): 309.

[14] [14] Gu Y, Wang C, Wang S, et al. Pattern Recognition Letters, 2011, 32(2): 114.

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Cen Yi, Zhang Genzhong, Zhang Lifu, Lu Xuhui, Zhang Feizhou. Spectral Uncertainty of Terrestrial Objects and the Applicability of Spectral Angle Mapper Algorithm[J]. Spectroscopy and Spectral Analysis, 2015, 35(10): 2841

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Paper Information

Received: Jul. 1, 2014

Accepted: --

Published Online: Nov. 18, 2020

The Author Email: Feizhou Zhang (zhangfz@pku.edu.cn)

DOI:10.3964/j.issn.1000-0593(2015)10-2841-05

Topics

laser devices and laser physics

Lasers and Laser Optics

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laser manufacturing

Instrumentation, Measurement and Metrology