Spectroscopy and Spectral Analysis, Volume. 40, Issue 11, 3394(2020)

Influence of Incident Angle and Polarization on Spectral Behaviors of Tapered Silicon Nanowire

Jie TONG1,1, Yu-qing LEI1,1, Ying-feng LI1,1, Mei-cheng LI1,1, Ming-hao ZHANG1,1, and Zhong-liang GAO1,1
Author Affiliations
  • 1[in Chinese]
  • 11. China Electric Power Research Institute, Beijing 100192, China
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    Jie TONG, Yu-qing LEI, Ying-feng LI, Mei-cheng LI, Ming-hao ZHANG, Zhong-liang GAO. Influence of Incident Angle and Polarization on Spectral Behaviors of Tapered Silicon Nanowire[J]. Spectroscopy and Spectral Analysis, 2020, 40(11): 3394

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    Paper Information

    Category: Research Articles

    Received: Oct. 28, 2019

    Accepted: --

    Published Online: Jun. 18, 2021

    The Author Email:

    DOI:10.3964/j.issn.1000-0593(2020)11-3394-05

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