Fig. 1. Development process of liquid crystal display technology^［6］

Fig. 2. Manufacturing process of TFT-LCD^［6］

Fig. 3. Schematic diagram of common Mura defects^［16］

Fig. 4. Comparison of three-dimensional maps of gray values of Mura defects with different filtering effects^［38］

Fig. 5. Comparison of brightness correction results^［29］

Fig. 6. Common Mura defect manifestations on LCD screens

Fig. 7. Screen surface Mura defect recognition results sheets^［40］

Fig. 8. Field of view simulation for defect detection^［45］

Fig. 9. TFT-LCD Mura defect visual inspection method in multiple backgrounds^［52］

Fig. 10. Localizing texture defects with the proposed MSCDAE model on marble samples（first row），LCD panel samples（second row），and fabric samples（third row）.（a）Original defect images；（b）Residual map of the first pyramid layers；（c）Residual map of the second pyramid layers；（d）Residual map of the third pyramid layers；（e）Final comprehensive results^［56］.

Fig. 11. Computational cost of the method based on the OS-ELM and that based on the ELM^［60］