Chinese Journal of Lasers, Volume. 45, Issue 12, 1211002(2018)

Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced reakdown Spectroscopy Technology

Junshan Xiu1、*, Shiming Liu1, Kunkun Wang1, Shenggui Fu1, Tao Wang2, and Yunyan Liu1、*
Author Affiliations
  • 1 School of Physics and Optoelectronic Engineering, Shandong University of Technology,Zibo, Shandong 255049, China
  • 2 Shandong Zibo Hanergy Thin Film Solar Cell Co. Ltd., Zibo, Shandong 255000, China
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    Figures & Tables(8)
    Diagram of LIBS experimental set-up for detecting CIGS thin film
    XRD spectrum of CIGS thin film
    LIBS spectra of CIGS thin film. (a) Spectral lines of Cu, In and Ga; (b) spectral lines of Cu I 327.39 nm at various working pressures
    Curves of LIBS intensity ratio and (a) xCu/x(In+Ga) or (b) xGa/x(In+Ga)
    LIBS intensity ratio of analytical spectral line of CIGS thin film deposited at various pressures
    Transmittance of CIGS thin films deposited at various pressures
    • Table 1. EDS analysis results of CIGS thin film deposited at various working pressures

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      Table 1. EDS analysis results of CIGS thin film deposited at various working pressures

      Pressure /PaxCu /%xIn /%xGa /%xSe /%xGa/x(In+Ga)xCu/x(In+Ga)
      0.521.66018.41256.957552.8550.27300.855
      1.021.90015.90007.360054.8000.32000.935
      2.020.03513.16256.995059.8050.34650.990
      2.521.03014.90006.080057.9900.29001.000
    • Table 2. LIBS spectral lines of target elements in CIGS thin film

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      Table 2. LIBS spectral lines of target elements in CIGS thin film

      ElementNumber of linesWavelength /nm
      Cu13324.75,327.39,329.05,330.79,465.11,510.55,515.32,521.82,529.25,570.02,578.21,793.31,809.26
      In6275.38,283.69,303.93,325.61,410.17,451.13
      Ga3287.42,403.29,417.20
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    Junshan Xiu, Shiming Liu, Kunkun Wang, Shenggui Fu, Tao Wang, Yunyan Liu. Analytical Investigation of Cu(In, Ga)Se2 Thin Films Using Laser Induced reakdown Spectroscopy Technology[J]. Chinese Journal of Lasers, 2018, 45(12): 1211002

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    Paper Information

    Category: spectroscopy

    Received: Jun. 21, 2018

    Accepted: Jul. 20, 2018

    Published Online: May. 9, 2019

    The Author Email:

    DOI:10.3788/CJL201845.1211002

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