Phase Imaging Based on Ptychography and Progress on Related Key Techniques

Pan Xingchen; Liu Cheng; Tao Hua; Liu Haigang; Zhu Jianqiang

doi:10.3788/AOS202040.0111010

Acta Optica Sinica, Volume. 40, Issue 1, 111010(2020)

Phase Imaging Based on Ptychography and Progress on Related Key Techniques

Pan Xingchen^1,2、*, Liu Cheng^1,2, Tao Hua^1,2, Liu Haigang³, and Zhu Jianqiang^1,2

¹Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²National Laboratory on High Power Laser and Physics, China Academy of Engineering Physics, Chinese Academy of Sciences, Shanghai 201800, China

³Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China

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Pan Xingchen, Liu Cheng, Tao Hua, Liu Haigang, Zhu Jianqiang. Phase Imaging Based on Ptychography and Progress on Related Key Techniques[J]. Acta Optica Sinica, 2020, 40(1): 111010

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Paper Information

Special Issue:

Received: Sep. 30, 2019

Accepted: --

Published Online: Jan. 6, 2020

The Author Email: Xingchen Pan (xchpan@siom.ac.cn)

DOI:10.3788/AOS202040.0111010

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology