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Laser & Optoelectronics Progress, Volume. 47, Issue 2, 21201(2010)

Review and Trends of Image Processing Method Based on Partial Differential Equations for Electronic Speckle Pattern Interferometry

Tang Chen1,2、*, Ren Hongwei2, Chen Xia1, Cai Yuanxue3, Han Lin1, Zhang Fang1, Lu Wenjing1, Wang Wenping1, Wang Zhifang1, and Gao Tao1
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Tang Chen, Ren Hongwei, Chen Xia, Cai Yuanxue, Han Lin, Zhang Fang, Lu Wenjing, Wang Wenping, Wang Zhifang, Gao Tao. Review and Trends of Image Processing Method Based on Partial Differential Equations for Electronic Speckle Pattern Interferometry[J]. Laser & Optoelectronics Progress, 2010, 47(2): 21201

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    Paper Information

    Category: Reviews

    Received: Jun. 15, 2009

    Accepted: --

    Published Online: Jan. 27, 2010

    The Author Email: Chen Tang (tangchen@tju.edu.cn)

    DOI:10.3788/lop47.021201

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology