[1] Liang Shaolin, Wang Yongmei, Mao Jinghua, et al. Test for pixel non-uniformity of scientific optical CCD[J]. Infrared and Laser Engineering, 48, 0417004(2019).

[2] Liu Yi, Shi Haodong, Jiang Huilin, et al. Infrared polarization properties of targets with rough surface[J]. Chinese Optics, 13, 459-471(2020).

[3] Ling Mingchun, Song Maoxin, Hong Jin, et al. Optical design for simultaneous polarization imager based on off-axis three-mirror[J]. Infrared and Laser Engineering, 48, 0518001(2019).

[4] Zhang Weiguo. Application of polarization detection technology under the background of sun flare on sea surface[J]. Chinese Optics, 11, 231-236(2018).

[5] Yao P P, Tu B H, Xu S L, et al. Non-uniformity calibration method of space-borne area CCD for directional polarimetric camera[J]. Optics Express, 3309-3326(2021).

[6] [6] Wang Zhongming. Techniques f evaluating singleevent effect in SRAMbased FPGAs [D]. Beijing: Tsinghua University, 2011. (in Chinese)

[7] Zhang Xuhui, Wang Yuanyuan, Dong Jianting, et al. Study on single event effect test of CCD video device[J]. Spacecraft Recovery & Remote Sensing, 39, 72-79(2018).

[8] Darracq F, Lapuyade H, Buard N, et al. Backside SEU laser testing for commercial off-the-shelf SRAMs[J]. IEEE Transactions on Nuclear Science, 49, 2977-2985(2002).

[9] Takahiro Tomioka, Yuta Okumura, Hirokazu Masui, et al. Screening of nanosatellite microprocessors using californium single-event latch-up test results[J]. Acta Astronautica, 334-341(2016).

[10] Schwank J R, Shaneyfelt M R, McMorrow D, et al. Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements[J]. IEEE Transactions on Nuclear Science, 57, 1827-1834(2010).

[11] Cao Zhou, Xue Yuxiong, Gao Xin, et al. Testing and research on single event effects of NAND flash memory[J]. Space Electronic Technology, 3, 81-86(2019).

[12] Wang Bo, Wang Liheng, Liu Weixin, et al. Single-event upset and damage mechanism in 8T-global shutter CMOS image sensors[J]. Acta Optica Sinica, 39, 0504001(2019).

[13] Han Jianwei, Shangguan Shipeng, Ma Yinqi, et al. Research progress for single event effects of space payloads by pulsed laser simulation[J]. Journal of Deep Space Exploration, 4, 577-584(2017).

[14] [14] Zhuang Haoyu. Highspeed highresolution CCD analog front end [D]. Xi’an: Xidian University, 2017. (in Chinese)

[15] Zhang Xuhu, Li Qiang, Wang Dianzhong, et al. Design and test verification of SEL control circuit for photoelectric signal processing system[J]. Spacecraft Environment Engineering, 37, 503-520(2020).

[16] Fang Lingli, Wang Yu, Qiu Xiaohan. et al. Application of integrated correlated double sampling A/D chip in satellite-borne devices[J]. Chinese Journal of Quantum Electronics, 34, 15-22(2017).

[17] Yao Pingping, Sun Liang, Xu Sunlong, et al. Design of a scientific-grade CCD refrigeration system and analysis of its temperature characteristics[J]. Acta Optica Sinica, 40, 1112002(2020).

[18] Hong Jin, Wang Zhengyun, Hu Yadong, et al. Research of life test and design of system for satellite-borne infrared detector assembly[J]. Optics and Precision Engineering, 26, 1148-1155(2018).

[19] Yao Pingping, Xun Sunlong, Tu Bihai, et al. Design of a performance test system and analysis of the temperature dependence for a space-borne area CCD[J]. Chinese Journal of Lasers, 47, 0910001(2020).

[20] Xue Xuecheng, Li Yunfei, Guo Yongfei. Design of analog front end of CCD imaging system[J]. Optics and Precision Engineering, 15, 1191-1195(2007).

[21] Yan Zhigang, Jiang Dezhong, Duan Ran. Analog front end design for high resolution CCD[J]. Aerospace Control, 28, 89-92(2010).

[22] Li Xiaoliang, Mei Bo, Li Pengwei, et al. Experimental study of single event latch-up of SRAM device under high temperatures[J]. Spacecraft Environment Engineering, 36, 589-593(2019).