Chinese Journal of Lasers, Volume. 36, Issue 5, 1214(2009)

Method of Measuring Anisotropy Seeback Coefficient of Thin Film Based on Laser Induced Thermoelectric Voltage Effect

Hu Juntao1、*, Li Hongshan1, ZuJie1, Zhang Guoyong2, and Zhang Pengxiang1
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    Hu Juntao, Li Hongshan, ZuJie, Zhang Guoyong, Zhang Pengxiang. Method of Measuring Anisotropy Seeback Coefficient of Thin Film Based on Laser Induced Thermoelectric Voltage Effect[J]. Chinese Journal of Lasers, 2009, 36(5): 1214

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    Paper Information

    Category: materials and thin films

    Received: Jun. 9, 2008

    Accepted: --

    Published Online: May. 22, 2009

    The Author Email: Hu Juntao (tom831120@163.com)

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