Chinese Journal of Lasers, Volume. 36, Issue 5, 1214(2009)

Method of Measuring Anisotropy Seeback Coefficient of Thin Film Based on Laser Induced Thermoelectric Voltage Effect

Hu Juntao1、*, Li Hongshan1, ZuJie1, Zhang Guoyong2, and Zhang Pengxiang1
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  • 1[in Chinese]
  • 2[in Chinese]
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    An analytical formula of temperature distrbution in La0.67Ca0.33MnO3 (LCMO) film irradiated by KrF excimer laser is presented using one-dimensional thermodiffusion model. The relation between surface temperature and irradiation duration of pulsed laser is obtained. Fitting the laser induced thermoelectric voltage (LITV) response waveform of LCMO film, it shows that the time constant is 1.39 μs. The thermal diffusion coefficient and conduction length of the film are calculated, and the results are 4.5×10-8 m2/s and 71 nm respectively. Based on the time constant and a simplified LITV formula, the anisotropy Seeback coefficient of thin films can be deduced, and it is 2.80 μV/K for LCMO.

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    Hu Juntao, Li Hongshan, ZuJie, Zhang Guoyong, Zhang Pengxiang. Method of Measuring Anisotropy Seeback Coefficient of Thin Film Based on Laser Induced Thermoelectric Voltage Effect[J]. Chinese Journal of Lasers, 2009, 36(5): 1214

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    Paper Information

    Category: materials and thin films

    Received: Jun. 9, 2008

    Accepted: --

    Published Online: May. 22, 2009

    The Author Email: Hu Juntao (tom831120@163.com)

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