Coherent optical adaptive technique improves the spatial resolution of STED microscopy in thick samples

Wei Yan; Yanlong Yang; Yu Tan; Xun Chen; Yang Li; Junle Qu; Tong Ye

doi:10.1364/PRJ.5.000176

Photonics Research, Volume. 5, Issue 3, 176(2017)

Coherent optical adaptive technique improves the spatial resolution of STED microscopy in thick samples

Wei Yan^1,2, Yanlong Yang³, Yu Tan², Xun Chen², Yang Li², Junle Qu^1,5、*, and Tong Ye^2,4,6、*

¹Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China

²Department of Bioengineering and the COMSET, Clemson University, Clemson, South Carolina 29634, USA

³State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Science, Xi’an 710119, China

⁴Department of Regenerative Medicine and Cell Biology, Medical University of South Carolina, Charleston, South Carolina 29425, USA

⁵e-mail: jlqu@szu.edu.cn

⁶e-mail: ye7@clemson.edu

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CLP Journals

[1] Jia Zhang, Soham Samanta, Jia-Lin Wang, Lu-Wei Wang, Zhi-Gang Yang, Wei Yan, Jun-Le Qu. Study on a novel probe for stimulated emission depletion Super-resolution Imaging of Mitochondria[J]. Acta Physica Sinica, 2020, 69(16): 168702-1

[2] Zhiping Zeng, Jing Ma, Canhua Xu, "Cross-cumulant enhanced radiality nanoscopy for multicolor superresolution subcellular imaging," Photonics Res. 8, 893 (2020)

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Wei Yan, Yanlong Yang, Yu Tan, Xun Chen, Yang Li, Junle Qu, Tong Ye, "Coherent optical adaptive technique improves the spatial resolution of STED microscopy in thick samples," Photonics Res. 5, 176 (2017)

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Paper Information

Category: Medical Optics and Biotechnology

Received: Jan. 16, 2017

Accepted: Mar. 3, 2017

Published Online: Oct. 9, 2018

The Author Email: Junle Qu (jlqu@szu.edu.cn), Tong Ye (ye7@clemson.edu)

DOI:10.1364/PRJ.5.000176

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology