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Photonics Research, Volume. 10, Issue 5, 1210(2022)

Intensity diffusion: a concealed cause of fringe distortion in fringe projection profilometry

Zheng Sun1、†, Minghui Duan1、†, Yabing Zheng, Yi Jin*, Xin Fan, and Jinjin Zheng
Author Affiliations
  • Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Hefei 230022, China
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    Article index updated: Jan. 11, 2025

    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 10 article(s) from Web of Science.
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
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    Zheng Sun, Minghui Duan, Yabing Zheng, Yi Jin, Xin Fan, Jinjin Zheng, "Intensity diffusion: a concealed cause of fringe distortion in fringe projection profilometry," Photonics Res. 10, 1210 (2022)

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    Paper Information

    Category: Instrumentation and Measurements

    Received: Dec. 22, 2021

    Accepted: Mar. 6, 2022

    Published Online: Apr. 14, 2022

    The Author Email: Yi Jin (jinyi08@ustc.edu.cn)

    DOI:10.1364/PRJ.451818

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology