[1] [1] Chen Qianghua, Luo Huifu, Wang Sumei, et al.. Measurement of air refractive index fluctuation based on interferometry with two different reference cavity lengths[J]. Appl Opt, 2012, 51(25): 6106-6110.

[2] [2] Dong Wei, Kiyoshi Takamasu, Hirokazu Matsumoto. Multiple pulse train interference-based measurement of refractive index of air using femtosecond optical frequency comb[C]. SPIE, 2012, 8563: 856314.

[3] [3] Wei Haoming, Xing Tingwen, Li Yun, et al.. Measurement errors in 632.8 nm high precision phase-shifting Fizeau interferometer[J]. Laser & Optoelectronics Progress, 2010, 47(4): 041202.

[4] [4] Ma Jichi, Li Yan, Sun Wenke, et al.. Fabry-Perot interferometer using tunable diode laser[J]. Acta Optica Sinica, 2008, 28(7): 1296-1300.

[5] [5] Miyata Kaoru, Oozeki Hidekazu, Nakagawa Hideyuki, et al.. Two-wavelength laser interferometer system which reduces the uncertainty caused by the fluctuation of the refractive index of air[J]. Int J Automation Technol, 2011, 5(2): 126-131.

[6] [6] Masashi Ishige, Masato Aketagawa, Banh Quoc Tuan, et al.. Measurement of air-refractive-index fluctuation from frequency change using a phase modulation homodyne interferometer and external cavity laser diode[J]. Meas Sci & Technol, 2009, 20(8): 084019.

[7] [7] Edlen Bengt. The refractive index of air[J]. Metrologia, 1966, 2(2): 71-80.

[8] [8] K P Birch, M J Downs. An updated Edlen equation for the refractive index of air[J]. Metrologia, 1993, 30(3): 155-162.

[9] [9] K P Birch, M J Downs. Correction to the updated Edlen equation for the refractive index of air[J]. Metrologia, 1994, 31(4): 315-316.

[10] [10] Zhang Zhuo, Chen Zhong, Zhong Li. An updated Edlen equation under low air pressure based on pattern search method[J]. Acta Metrologia Sinica, 2005, 26(3): 221-224.

[11] [11] Philip E Ciddor. Refractive index: new equations for the visible and near infrared[J]. Appl Opt, 1996, 35(9): 1566-1573.

[12] [12] Richard J Mathar. Refractive index of humid air in the infrared: model fits[J]. J Opt A: Pure & Appl Opt, 2007, 9(5): 470-476.

[13] [13] G Boensch, E Potulski. Measurement of the refractive index of air and comparison with modified Edlen′ formulae[J]. Metrologia, 1998, 35(2): 133-139.

[14] [14] Li Liyan, Wang Jian, Han Chunyang, et al.. Integration single frequency laser interferometer used to nanometer measurement[J]. Chinese J Lasers, 2011, 38(4): 0408001.

[15] [15] Hou Wenmei, Zhang Yunbo, Le Yanfen, et al.. Elimination of the nonlinearity of heterodyne displacement interferometers[J]. Chinese J Lasers, 2012, 39(9): 0908006.

[16] [16] He Le, Wang Xiangchao, Ma Mingying, et al.. Novel method for measuring non-orthogonality of interferometer system in step and scan lithographic tool[J]. Chinese J Lasers, 2007, 34(8): 1130-1135.

[17] [17] Zhao Meirong, Qu Xinghua, Lu Boyin. OPD multiplicated new laser interferomter with nanometric accuracy[J]. Chinese J Lasers, 2000, 27(5): 431-434.

[18] [18] R Schoedel, G Boensch. Precise interferometric measurements at single crystal silicon yielding thermal expansion coefficients from 12 ℃ to 28 ℃ and compressibility[C]. SPIE, 2001, 4401: 54-62.

[19] [19] Chen Qianghua, Luo Huifu, Wang Sumei, et al.. Measurement of air refractive index based on surface plasmon resonance and phase detection by dual-frequency laser interferometry[J]. Chinese J Lasers, 2013, 40(1): 0108001.