Design and Analysis of the Baffle of the Ritchey-Chretien (R-C) System Used in Space Remote Sensor

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Acta Optica Sinica, Volume. 20, Issue 6, 821(2000)

[in Chinese]¹, [in Chinese]¹, [in Chinese]¹, and [in Chinese]²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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References(8)

[1] [1] Robert P B. Problem and techniques in stray radiation suppression. Proc. SPIE, 1977, 107:58～65

[2] [2] Lansing J C. Thematic mapper design description and performance prediction. Proc. SPIE, 1979, 183:224～234

[3] [3] Young A T. Design of Cassegrain light shields. Appl. Opt., 1967, 6(6):1063～1067

[4] [4] Prescott R. Cassegrain baffle design. Appl. Opt., 1968, 7(3):479～481

[5] [5] Davis P K. Baffle design for telescope with tiltable secondary mirrors. Proc. SPIE, 1987, 766:163～168

[6] [6] Greynolds A W. Formulas for estimating stray-radiation levels in well-baffled optical systems. Proc. SPIE, 1977, 257:39～49

[7] [7] Bamberg J A. Stray light analysis with the HP-41C/CV calculator. Proc. SPIE, 1983, 384:109～116

[8] [8] Freniere E R, Skelton D L. Use of specular black coatings in well-baffled optical systems. Proc. SPIE, 1986, 675:126～132

CLP Journals

[1] Niu Jinxing, Zhou Renkui, Liu Zhaohui, Yang Jianguo, Cai Zhan′en, Lin Futiao. Analysis of Stray Light Caused by Thermal Radiation of Infrared Detection System[J]. Acta Optica Sinica, 2010, 30(8): 2267

[2] Du Baolin, Li Lin, Huang Yifan, Jiang Zhenyu, Zhao Yuanyuan. Optimum Design and Analysis of Vane in Satellite Remote Sensor[J]. Acta Optica Sinica, 2008, 28(s2): 233

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Design and Analysis of the Baffle of the Ritchey-Chretien (R-C) System Used in Space Remote Sensor[J]. Acta Optica Sinica, 2000, 20(6): 821

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jan. 4, 1999

Accepted: --

Published Online: Aug. 9, 2006

The Author Email:

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology