Chinese Journal of Lasers, Volume. 39, Issue 8, 803004(2012)

Surface Structure Features of Polished Fused Silica Revealed by Etching and Thermal Treating

Yang Minghong1,2、*, Zhao Yuan′an1, Shan Haiyang1,2, Yi Kui1, and Shao Jianda1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(14)

    [1] [1] Yang Minghong, Zhao Yuan′an, Yi Kui et al.. Subsurface damage characterization of ground fused silica by HF etching combined with polishing layer by layer[J]. Chinese J. Lasers, 2012, 39(3): 0303007

    [2] [2] J. Neauport, C. Ambard, P. Cormont et al.. Subsurface damage measurement of ground fused silica parts by HF etching techniques[J]. Opt. Express, 2009, 17: 20448~20456

    [3] [3] T. Suratwala, L. Wong. P. Miller et al.. Sub-surface mechanical damage distributions during grinding of fused silica[J]. Journal of Non-Crystalline Solids, 2006, 352: 5601~5617

    [4] [4] T. Suratwala, R. Steele, M. D. Feit et al.. Effect of rogue particles on the sub-surface damage of fused silica during grinding/polishing[J]. Journal of Non-Crystalline Solids, 2008, 354: 2023~2037

    [5] [5] Z. Wang, Y. Wu, Y. Dai et al.. Subsurface damage distribution in the lapping process[J]. Appl. Opt., 2008, 47: 1417~1426

    [6] [6] P. E. Miller, T. I. Suratwala, J. D. Bude et al.. Laser damage precursors in fused silica[C]. SPIE, 2009, 7504: 75040X

    [7] [7] P. E. Miller, J. D. Bude, T. I. Suratwala et al.. Fracture-induced subbandgap absorption as a precursor to optical damage on fused silica surfaces[J]. Opt. Lett., 2010, 35: 2702~2704

    [8] [8] M. R. Kozlowski. J. Carr, I. D. Hutcheon et al.. Depth profiling of polishing-induced contamination on fused silica surfaces[C]. SPIE, 1998, 3244: 365~375

    [9] [9] J. Bellum, D. Kletecka, M. Kimmel et al.. Laser damage by ns and sub-ps pulses on hafnia/silica anti-reflection coatings on fused silica double-sided polished using zirconia or ceria and washed with or without an alumina wash step[C]. SPIE, 2010, 7842: 784208

    [10] [10] Mhong Yang, Hongji Qi, Yuanan Zhao et al.. Reduction of the 355-nm laser-induced damage initiators by removing the subsurface cracks in fused silica[C]. SPIE, 2011, 8206: 82061C

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    [12] [12] L. M. Cook. Chemical processes in glass polishing[J]. Journal of Non-Crystalline Solids, 1990, 120: 152~171

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    [14] [14] F. V. Tooley. The Handbook of Glass Manufacture[M]. Vol.Ⅱ, New York: Ashlee, 1984. 801

    CLP Journals

    [1] Yang Minghong, Zhao Yuan′an, Su Hanhan, Shan Haiyang, Yi Kui, Shao Jianda. Influence of Subsurface Cracks on the Laser Damage Resistance of Anti-Reflection Coated Fused Silica[J]. Chinese Journal of Lasers, 2012, 39(8): 807001

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    Yang Minghong, Zhao Yuan′an, Shan Haiyang, Yi Kui, Shao Jianda. Surface Structure Features of Polished Fused Silica Revealed by Etching and Thermal Treating[J]. Chinese Journal of Lasers, 2012, 39(8): 803004

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    Paper Information

    Category: laser manufacturing

    Received: Mar. 21, 2012

    Accepted: --

    Published Online: Jul. 9, 2012

    The Author Email: Minghong Yang (yangmh@siom.ac.cn)

    DOI:10.3788/cjl201239.0803004

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