Opto-Electronic Engineering, Volume. 31, Issue 2, 37(2004)

On-Line Measurement and Analysis System for Elevator Rail Surface Profile

[in Chinese]1, [in Chinese]2, [in Chinese]1, and [in Chinese]1
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  • 2[in Chinese]
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    [1] ZHANG Xue-dian, QIAN Yan-hua, CHANG Min, JIANG Min-shan. Monitoring Method for Filter Film Thickness Based on the Combination of Photoelectric Extreme Value and Quartz Crystal Oscillation[J]. Acta Photonica Sinica, 2016, 45(6): 631001

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. On-Line Measurement and Analysis System for Elevator Rail Surface Profile[J]. Opto-Electronic Engineering, 2004, 31(2): 37

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    Paper Information

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    Received: Jan. 17, 2003

    Accepted: --

    Published Online: Nov. 14, 2007

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