Acta Optica Sinica, Volume. 45, Issue 11, 1122002(2025)

An Automatic System for PDE Spectrum Measurement Based on ER‑TDC: Design and Performance Characterization

Shucong Zhao1,2,3,4, Lin Yan2、*, Yujie Peng2, Peng Xiao2, Jiaming Tang2, Wanjun Hu2, Junwen Xue4、***, and Siguang Ma2、**
Author Affiliations
  • 1School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, Jilin , China
  • 2Ji Hua Laboratory, Foshan 528200, Guangdong , China
  • 3Key Laboratory of Optoelectronic Measurement & Optical Information Transmission Technology, Ministry of Education, School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, Jilin , China
  • 4Zhongshan Institute, Changchun University of Science and Technology, Zhongshan 528400, Guangdong , China
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    Figures & Tables(13)
    Principle of operation of ER-TDC. (a) Timing diagram; (b) typical example of measured histogram (δt>tpw)
    Schematic diagrams of two automatic systems designed and developed in this study for PDE spectrum measurement. (a) ER-TDC-based system; (b) traditional SDS method (i.e., counter)-based system
    Schematic diagram of the connections between SSC and LED array
    An automatic PDE spectrum measurement procedure based on ER-TDC
    Spectral emission characteristics of each LED in the LED array. (a) Emission spectra; (b) central wavelength and spectral width
    Normalized spectra of LED680L at different emission powers
    Temporal emission characteristics of each LED in the LED array. (a) Temporal profile; (b) pulse width
    Power calibration coefficients for individual LEDs in the LED array
    Distributions of event arrival times measured by the ER-TDC under LED680L illumination
    Distributions of event arrival times measured using the ER-TDC at different light pulse periods and the inset shows PDEs for the corresponding periods
    Mean number of detected photoelectrons μ and PDE as functions of incident photon flux
    Comparison of PDEs of the Si-SPAD measured using different methods. (a) PDE spectra; (b) relative combined standard uncertainties of PDEs
    • Table 1. Performance comparison of different PDE spectrum automatic testing systems

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      Table 1. Performance comparison of different PDE spectrum automatic testing systems

      SystemER-TDCTraditional SDS
      Single-color LED

      Halogen lamp +

      monochromator

      Laser-driven light

      source + monochromator

      GaN laser diode + tunable bandpass filter
      Ref.This workThis work[18][26]
      Wavelength range /nm400‒1100400‒1100250‒1000480‒840
      uc, r(ηSPD) /%2.1‒3.1 @400‒1000 nm2.0‒3.1 @400‒1000 nm0.6‒3.00.8‒2.2
      Tacq /(s·point-1122120
      Correction neededNoYesYesYes
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    Shucong Zhao, Lin Yan, Yujie Peng, Peng Xiao, Jiaming Tang, Wanjun Hu, Junwen Xue, Siguang Ma. An Automatic System for PDE Spectrum Measurement Based on ER‑TDC: Design and Performance Characterization[J]. Acta Optica Sinica, 2025, 45(11): 1122002

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Mar. 17, 2025

    Accepted: Apr. 9, 2025

    Published Online: Jun. 24, 2025

    The Author Email: Lin Yan (yanlin@jihualab.com), Junwen Xue (xuejunwen001@126.com), Siguang Ma (masg@jihualab.com)

    DOI:10.3788/AOS250754

    CSTR:32393.14.AOS250754

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