Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy

Jiaji Li; Alex Matlock; Yunzhe Li; Qian Chen; Lei Tian; Chao Zuo

doi:10.1364/PRJ.403873

Photonics Research, Volume. 8, Issue 12, 1818(2020)

Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy

Jiaji Li^1,2, Alex Matlock³, Yunzhe Li³, Qian Chen¹, Lei Tian^3,4, and Chao Zuo^1,2、*

Author Affiliations

¹School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China

²Smart Computational Imaging Laboratory (SCILab), Nanjing University of Science and Technology, Nanjing 210094, China

³Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts 02215, USA

⁴e-mail: leitian@bu.edu

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Jiaji Li, Alex Matlock, Yunzhe Li, Qian Chen, Lei Tian, Chao Zuo, "Resolution-enhanced intensity diffraction tomography in high numerical aperture label-free microscopy," Photonics Res. 8, 1818 (2020)

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Paper Information

Category: Imaging Systems, Microscopy, and Displays

Received: Jul. 31, 2020

Accepted: Sep. 30, 2020

Published Online: Nov. 13, 2020

The Author Email: Chao Zuo (zuochao@njust.edu.cn)

DOI:10.1364/PRJ.403873

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