Chinese Journal of Lasers, Volume. 37, Issue 2, 543(2010)

A Method of Curvature Measurement Based on Charge Coupled Device Dual-Laser Collimation

Lu Quan*, Han Baojun, Liu Shangqian, and Wang Huifeng
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    Lu Quan, Han Baojun, Liu Shangqian, Wang Huifeng. A Method of Curvature Measurement Based on Charge Coupled Device Dual-Laser Collimation[J]. Chinese Journal of Lasers, 2010, 37(2): 543

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    Paper Information

    Category: measurement and metrology

    Received: Apr. 13, 2009

    Accepted: --

    Published Online: Feb. 3, 2010

    The Author Email: Quan Lu (luquanwater@163.com)

    DOI:10.3788/cjl20103702.0543

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