Infrared and Laser Engineering, Volume. 51, Issue 4, 20210403(2022)

Method for phase-height mapping calibration based on fringe projection profilometry

Yanjun Fu1,2, Xiaoqi Cai1, Kejun Zhong1, Baiheng Ma2, and Zhanjun Yan2
Author Affiliations
  • 1Key Laboratory of Nondestructive Testing, Education Ministry of China, Nanchang Hangkong University, Nanchang 330063, China
  • 2Science and Technology on Electro-optic Control Laboratory, Luoyang 471023, China
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    Yanjun Fu, Xiaoqi Cai, Kejun Zhong, Baiheng Ma, Zhanjun Yan. Method for phase-height mapping calibration based on fringe projection profilometry[J]. Infrared and Laser Engineering, 2022, 51(4): 20210403

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    Paper Information

    Category: Photoelectric measurement

    Received: Jun. 16, 2021

    Accepted: --

    Published Online: May. 18, 2022

    The Author Email:

    DOI:10.3788/IRLA20210403

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