Chinese Journal of Lasers, Volume. 46, Issue 12, 1204003(2019)

Birefringence Measurement Based on Ptychographic Iterative Engine in Planar Polarimeter

Bei Cheng1,2,3, Xuejie Zhang2, Cheng Liu2, and Jianqiang Zhu2、*
Author Affiliations
  • 1School of Physical Science and Technology, Shanghai Tech University, Shanghai 201210, China
  • 2Joint Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences, Shanghai 201800, China
  • 3Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences,Beijing 100049, China
  • show less

    A novel birefringence measurement method based on a ptychographic iterative engine (PIE) in a planar polarimeter is proposed in this paper. The complex amplitudes formed by a sample in a dark field under two different polarization states are reconstructed using the proposed PIE method. The phase retardation and azimuth angle are simply and accurately extracted from the probe phase and ratio of two complex amplitudes, respectively, and the two-dimensional quantitative measurement of birefringence samples is realized. A birefringence resolution target is used to verify the proposed method, and the obtained results are completely consistent with the resolution target's actual distributions. The maximum phase retardation error is no more than 23.9 nm, and the azimuth angle error is 0.49°. This method has a simple structure and enables a traditional planar polarimeter to quantitatively measure birefringence. The proposed method reduces the number of required PIE scans and shortens the data collection time and processing process, providing a practical method for the birefringence measurement of large-aperture optical devices.

    Tools

    Get Citation

    Copy Citation Text

    Bei Cheng, Xuejie Zhang, Cheng Liu, Jianqiang Zhu. Birefringence Measurement Based on Ptychographic Iterative Engine in Planar Polarimeter[J]. Chinese Journal of Lasers, 2019, 46(12): 1204003

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: measurement and metrology

    Received: Jul. 9, 2019

    Accepted: Aug. 19, 2019

    Published Online: Dec. 2, 2019

    The Author Email: Zhu Jianqiang (jqzhu@siom.ac.cn)

    DOI:10.3788/CJL201946.1204003

    Topics