Chinese Journal of Lasers, Volume. 41, Issue 9, 906001(2014)

Using Fluorescent Microscopy Method to Study Subsurface Defects in Nd-Doped Phosphate Laser Glasses

Wang Wei1,2、*, Zhang Lei1, Feng Suya1, Chen Wei1, and Hu Lili1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    CLP Journals

    [1] Wang Huadong, Zhang Taihua. Research Progresses on Characterization and Detection Technology of Subsurface Damages in Optical Materials[J]. Laser & Optoelectronics Progress, 2017, 54(10): 100003

    [2] Li Meng, Xu Yongchun, Wang Congjuan, Chen Wei, Hu Lili. Short-Time Hydrolization and XPS Characterization for Nd-Doped Phosphate Laser Glass[J]. Chinese Journal of Lasers, 2015, 42(9): 906006

    [3] Zhang Bo, Ni Kaizao, Wang Linjun, Liu Shijie, Wu Lunzhe. New Algorithm of Detecting Optical Surface Imperfection Based on Background Correction and Image Segmentation[J]. Acta Optica Sinica, 2016, 36(9): 911004

    [4] You Kewei, Zhang Yanli, Zhang Xuejie, Zhang Junyong, Zhu Jianqiang. Influence of Relative Position of Optical Component Surface Defects on Near Field Beam Quality[J]. Collection Of theses on high power laser and plasma physics, 2015, 13(1): 308004

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    Wang Wei, Zhang Lei, Feng Suya, Chen Wei, Hu Lili. Using Fluorescent Microscopy Method to Study Subsurface Defects in Nd-Doped Phosphate Laser Glasses[J]. Chinese Journal of Lasers, 2014, 41(9): 906001

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    Paper Information

    Category: materials and thin films

    Received: Mar. 17, 2014

    Accepted: --

    Published Online: Aug. 15, 2014

    The Author Email: Wei Wang (lplace123@gmail.com)

    DOI:10.3788/cjl201441.0906001

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